caa a22 4500 469039957 CHVBK 20180323132808.0 cr unu---uuuuu 170328e19921201xx s 000 0 eng 10.1007/BF00135336 doi (NATIONALLICENCE)springer-10.1007/BF00135336 McEuen Steven Ford Microelectronics, Inc., 9965 Federal Drive, 80921, Colorado Springs, CO, USA aut Reliability benefits of I DDQ [Elektronische Daten] [Steven McEuen] This is an application-oriented article on I DDQ to guide test engineers to a pragmatic method of implementing I DDQ . This article focuses on different aspects of I DDQ testing; quality, reliability, and test implementation. A description of I DDQ is presented, with different practical methods of implementing it, with empirical reliability data of I DDQ failures, and with empirical burn-in data identifying potential yield benefits. Employing I DDQ testing on digital CMOS technology, the user obtains a product with greater reliability. The data presented within this article, along with increasing customer focus on zero defects, clearly support I DDQ implementation. Kluwer Academic Publishers, 1992 I DDQ nationallicence Gate oxide shorts nationallicence reliability nationallicence Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 327-335 0923-8174 3:4<327 1992 3 10836 https://doi.org/10.1007/BF00135336 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00135336 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- McEuen Steven Ford Microelectronics, Inc., 9965 Federal Drive, 80921, Colorado Springs, CO, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 327-335 0923-8174 3:4<327 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer