caa a22 4500 469039981 CHVBK 20180323132808.0 cr unu---uuuuu 170328e19921201xx s 000 0 eng 10.1007/BF00135340 doi (NATIONALLICENCE)springer-10.1007/BF00135340 Aitken Robert Design Technology Center, Hewlett-Packard Co., 5301 Stevens Creek Blvd. MS 53U/36, 95052-8059, Santa Clara, CA, USA aut Diagnosis of leakage faults with I DDQ [Elektronische Daten] [Robert Aitken] Recently there has been renewed interest in fault detection in static CMOS circuits through I DDQ monitoring. This work shows that, in addition to fault detection, accurate fault diagnosis may be performed using a combination of current and voltage observations. The proposed system combines a simple single fault model for test generation with a more realistic multiple defect model for diagnosis, and as a result requires only minor modifications to existing stuck-at fault ATPG software. The associated hardware is sufficiently simple that on-board implementation is possible. Experimental results demonstrate the effectiveness of the method on a standard-cell ASIC. Kluwer Academic Publishers, 1992 Fault diagnosis nationallicence I DDQ testing nationallicence leakage fault model nationallicence Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 367-375 0923-8174 3:4<367 1992 3 10836 https://doi.org/10.1007/BF00135340 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00135340 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Aitken Robert Design Technology Center, Hewlett-Packard Co., 5301 Stevens Creek Blvd. MS 53U/36, 95052-8059, Santa Clara, CA, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 367-375 0923-8174 3:4<367 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer