caa a22 4500 469040009 CHVBK 20180323132808.0 cr unu---uuuuu 170328e19920501xx s 000 0 eng 10.1007/BF00137252 doi (NATIONALLICENCE)springer-10.1007/BF00137252 On the design of random pattern testable PLA based on weighted random pattern testing [Elektronische Daten] [Dong Ha, Sudhakar Reddy] Programmable Logic Arrays (PLAs) provide a cost effective method to realize combinational logic circuits. PLAs are often not suitable for random pattern testing due to high fao-in of gates. In order to reduce the effective fan-in of gates, previous random pattern testable (RPT) PLA designs focused on partitioning inputs and product lines. In this paper we propose a new random pattern testable design of PLAs which is suitable for built-in selftest. The key idea of the proposed design is to apply weighted random patterns to the PLA under test. The proposed design method was applied to 30 example PLAs. The performance of the RPT PLAs was measured in the size of test set, area overhead, and time overhead, and compared with two other designs in test length and fault coverage. The experimental results show that the proposed design achieve short test length and high fault coverage. Kluwer Academic Publishers, 1992 built-in self-test nationallicence PLA nationallicence random pattern testability nationallicence testable design nationallicence Ha Dong The Bradley Department of Electrical Engineering, Virginia Polytechnic Institute and State University, 24061, Blacksburg, VA, USA aut Reddy Sudhakar Department of Electrical and Computer Engineering, University of Iowa, 52242, Iowa City, Iowa, USA aut Journal of Electronic Testing Kluwer Academic Publishers 3/2(1992-05-01), 149-157 0923-8174 3:2<149 1992 3 10836 https://doi.org/10.1007/BF00137252 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00137252 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Ha Dong The Bradley Department of Electrical Engineering, Virginia Polytechnic Institute and State University, 24061, Blacksburg, VA, USA aut NATIONALLICENCE 700 1- Reddy Sudhakar Department of Electrical and Computer Engineering, University of Iowa, 52242, Iowa City, Iowa, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/2(1992-05-01), 149-157 0923-8174 3:2<149 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer