caa a22 4500 46904005X CHVBK 20180323132808.0 cr unu---uuuuu 170328e19920501xx s 000 0 eng 10.1007/BF00137248 doi (NATIONALLICENCE)springer-10.1007/BF00137248 The Comparative and Concurrent Simulation of discrete-event experiments [Elektronische Daten] [Ernst Ulrich, Karen Lentz, Jack Arabian, Michael Gustin, Vishwani Agrawal, Pier Montessoro] Discrete-Event Simulation is a powerful, but underexploited alternative for many kinds of physical experimentation. It permits what is physically impossible or unaffordable, to conduct and run related experiments in parallel, against each other. Comparative and Concurrent Simulation (CCS) is a parallel experimentation method that adds a comparative dimension to discrete-event simulation. As a methodology or style, CCS resembles a many-pronged rake; its effectiveness is proportional to the number of prongs—the number of parallel experiments. It yields information in parallel and in time order, rather than in the arbitrary order of one-pronged serial simulations. CCS takes advantage of the similarities between parallel experiments via the one-for-many simulation of their identical parts; if many experiments are simulated, then it is normally hundreds to thousands times faster than serial simulation. While CCS is a one-dimensional method, a more general, multi-dimensional or multidomain version is MDCCS. MDCCS permits parent experiments to interact and produce offspring experiments, i.e., to produce more, but smaller experiments, and many zero-size/zero-cost experiments. MDCCS is more general, informative, and faster (usually over 100:1) than CCS for most applications. It handles more complex applications and experiments, such as multiple faults, variant executions of a software program, animation, and others. Kluwer Academic Publishers, 1992 Discrete-event simulation nationallicence parallel simulation nationallicence concurrent simulation nationallicence comparative simulation nationallicence Ulrich Ernst Digital Equipment Corporation, 146 Main Street, 01754, Maynard, MA, USA aut Lentz Karen Digital Equipment Corporation, 146 Main Street, 01754, Maynard, MA, USA aut Arabian Jack Digital Equipment Corporation, 146 Main Street, 01754, Maynard, MA, USA aut Gustin Michael Digital Equipment Corporation, 146 Main Street, 01754, Maynard, MA, USA aut Agrawal Vishwani AT&T Bell Laboratories, 07974, Murray Hill, NJ, USA aut Montessoro Pier Politecnico di Torino, Italy aut Journal of Electronic Testing Kluwer Academic Publishers 3/2(1992-05-01), 107-118 0923-8174 3:2<107 1992 3 10836 https://doi.org/10.1007/BF00137248 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00137248 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Ulrich Ernst Digital Equipment Corporation, 146 Main Street, 01754, Maynard, MA, USA aut NATIONALLICENCE 700 1- Lentz Karen Digital Equipment Corporation, 146 Main Street, 01754, Maynard, MA, USA aut NATIONALLICENCE 700 1- Arabian Jack Digital Equipment Corporation, 146 Main Street, 01754, Maynard, MA, USA aut NATIONALLICENCE 700 1- Gustin Michael Digital Equipment Corporation, 146 Main Street, 01754, Maynard, MA, USA aut NATIONALLICENCE 700 1- Agrawal Vishwani AT&T Bell Laboratories, 07974, Murray Hill, NJ, USA aut NATIONALLICENCE 700 1- Montessoro Pier Politecnico di Torino, Italy aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/2(1992-05-01), 107-118 0923-8174 3:2<107 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer