caa a22 4500 469092319 CHVBK 20180323133020.0 cr unu---uuuuu 170328e19920501xx s 000 0 eng 10.1007/BF02655616 doi (NATIONALLICENCE)springer-10.1007/BF02655616 Fabrication and characterization of Ti-Ba-Ca-Cu-O superconducting films on LaAlO3 substrates [Elektronische Daten] [P. Arendt, N. Elliott, R. Dye, K. Hubbard, M. Maley, J. Martin, Y. Coulter, B. Bennett] A multi-step process is used to fabricate Tl2Ba2Ca1Cu2O8 films on (100) LaA103 substrates. Submicron thick precursor films of Ba-Ca-Cu-O are rf magnetron sputter deposited from a single target. Film stoichiometry is measured by ion beam backscattering spectroscopy. Deficiencies of the alkaline earths that are found in the precursor films are then compensated for by the addition of appropriate CaF2 and/or BaF2 films onto the surface of the precursor film. Post deposition annealing of the films is then done in an atmosphere of thallium oxide and oxygen in order to form the superconducting phases. The annealed films are examined using x-ray diffraction (XRD), an ac inductance technique, and critical current in an external magnetic field. XRD shows the c-axis length of the superconducting phase to increase as the overall film stoichiometry approaches 2212. The transition widths measured by inductive coupling weakly correlate with 77 K critical current measurements. Our best critical current results are 1.5*106 amps/ cm2 for a film measured at 4 K in an 8 T magnetic field (parallel to the films' c-axis). TMS, 1992 TIBaCaCuO films nationallicence superconductivity nationallicence LaA103 substrates nationallicence Arendt P. Los Alamos National Laboratory, 87545, Los Alamos, NM aut Elliott N. Los Alamos National Laboratory, 87545, Los Alamos, NM aut Dye R. Los Alamos National Laboratory, 87545, Los Alamos, NM aut Hubbard K. Los Alamos National Laboratory, 87545, Los Alamos, NM aut Maley M. Los Alamos National Laboratory, 87545, Los Alamos, NM aut Martin J. Los Alamos National Laboratory, 87545, Los Alamos, NM aut Coulter Y. Los Alamos National Laboratory, 87545, Los Alamos, NM aut Bennett B. Los Alamos National Laboratory, 87545, Los Alamos, NM aut Journal of Electronic Materials Springer-Verlag 21/5(1992-05-01), 499-501 0361-5235 21:5<499 1992 21 11664 https://doi.org/10.1007/BF02655616 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02655616 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Arendt P. Los Alamos National Laboratory, 87545, Los Alamos, NM aut NATIONALLICENCE 700 1- Elliott N. Los Alamos National Laboratory, 87545, Los Alamos, NM aut NATIONALLICENCE 700 1- Dye R. Los Alamos National Laboratory, 87545, Los Alamos, NM aut NATIONALLICENCE 700 1- Hubbard K. Los Alamos National Laboratory, 87545, Los Alamos, NM aut NATIONALLICENCE 700 1- Maley M. Los Alamos National Laboratory, 87545, Los Alamos, NM aut NATIONALLICENCE 700 1- Martin J. Los Alamos National Laboratory, 87545, Los Alamos, NM aut NATIONALLICENCE 700 1- Coulter Y. Los Alamos National Laboratory, 87545, Los Alamos, NM aut NATIONALLICENCE 700 1- Bennett B. Los Alamos National Laboratory, 87545, Los Alamos, NM aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer-Verlag 21/5(1992-05-01), 499-501 0361-5235 21:5<499 1992 21 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer