<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>     caa a22        4500</leader>
  <controlfield tag="001">469092424</controlfield>
  <controlfield tag="003">CHVBK</controlfield>
  <controlfield tag="005">20180323133021.0</controlfield>
  <controlfield tag="007">cr unu---uuuuu</controlfield>
  <controlfield tag="008">170328e19920501xx      s     000 0 eng  </controlfield>
  <datafield tag="024" ind1="7" ind2="0">
   <subfield code="a">10.1007/BF02655620</subfield>
   <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/BF02655620</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="4">
   <subfield code="a">The implementation of the power law model in silicon oxidation process simulation</subfield>
   <subfield code="h">[Elektronische Daten]</subfield>
   <subfield code="c">[Zhi-Min Ling, Luc Dupas, Kristin De Meyer]</subfield>
  </datafield>
  <datafield tag="520" ind1="3" ind2=" ">
   <subfield code="a">The purpose of this work is to extend the power-law model1 to a semi-empirical oxidation model for process simulation. The proposed model benefits from a very simple model formulation, when compared to an existing model there are fewer parameter variables and simpler expressions of parameter dependence for a wide range of oxidation conditions while maintaining a very good overall fitting accuracy. The model covers dry oxidation for different pressures, temperatures, orientations, oxidation in a HC1/O2 ambient, doping enhanced oxidation phenomena, as well as wet oxidation for different pressure, orientation and temperature conditions. To develop the model, a strategy for parameter extraction,2 combined with optimal adaptation is proposed. This approach includes two steps. One is the determination of the parameter correlation matrix and the e-indifference range for each oxidation condition(e.g. temperature). The second step is the parameter adaptation within the ε-indifference range to obtain a simple parameter variation over a wide range of oxidation conditions. As a consequence of this work, the proposed model is a possible replacement for the oxidation model of SUPREM-33 in process simulation. The optimized parameter extraction strategy can be applied to a large class of modelling problems.</subfield>
  </datafield>
  <datafield tag="540" ind1=" " ind2=" ">
   <subfield code="a">TMS, 1992</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">Si</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">Si oxidation</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">power law model</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Ling</subfield>
   <subfield code="D">Zhi-Min</subfield>
   <subfield code="u">IMEC, Kapeldreef 75, B-3030, Leuven, Heverlee, Belgium</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Dupas</subfield>
   <subfield code="D">Luc</subfield>
   <subfield code="u">IMEC, Kapeldreef 75, B-3030, Leuven, Heverlee, Belgium</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">De Meyer</subfield>
   <subfield code="D">Kristin</subfield>
   <subfield code="u">IMEC, Kapeldreef 75, B-3030, Leuven, Heverlee, Belgium</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
   <subfield code="t">Journal of Electronic Materials</subfield>
   <subfield code="d">Springer-Verlag</subfield>
   <subfield code="g">21/5(1992-05-01), 523-532</subfield>
   <subfield code="x">0361-5235</subfield>
   <subfield code="q">21:5&lt;523</subfield>
   <subfield code="1">1992</subfield>
   <subfield code="2">21</subfield>
   <subfield code="o">11664</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="u">https://doi.org/10.1007/BF02655620</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="908" ind1=" " ind2=" ">
   <subfield code="D">1</subfield>
   <subfield code="a">research-article</subfield>
   <subfield code="2">jats</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/BF02655620</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Ling</subfield>
   <subfield code="D">Zhi-Min</subfield>
   <subfield code="u">IMEC, Kapeldreef 75, B-3030, Leuven, Heverlee, Belgium</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Dupas</subfield>
   <subfield code="D">Luc</subfield>
   <subfield code="u">IMEC, Kapeldreef 75, B-3030, Leuven, Heverlee, Belgium</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">De Meyer</subfield>
   <subfield code="D">Kristin</subfield>
   <subfield code="u">IMEC, Kapeldreef 75, B-3030, Leuven, Heverlee, Belgium</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">773</subfield>
   <subfield code="E">0-</subfield>
   <subfield code="t">Journal of Electronic Materials</subfield>
   <subfield code="d">Springer-Verlag</subfield>
   <subfield code="g">21/5(1992-05-01), 523-532</subfield>
   <subfield code="x">0361-5235</subfield>
   <subfield code="q">21:5&lt;523</subfield>
   <subfield code="1">1992</subfield>
   <subfield code="2">21</subfield>
   <subfield code="o">11664</subfield>
  </datafield>
  <datafield tag="900" ind1=" " ind2="7">
   <subfield code="a">Metadata rights reserved</subfield>
   <subfield code="b">Springer special CC-BY-NC licence</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="898" ind1=" " ind2=" ">
   <subfield code="a">BK010053</subfield>
   <subfield code="b">XK010053</subfield>
   <subfield code="c">XK010000</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
 </record>
</collection>
