caa a22 4500 469104600 CHVBK 20180323133053.0 cr unu---uuuuu 170328e19920901xx s 000 0 eng 10.1007/BF01634791 doi (NATIONALLICENCE)springer-10.1007/BF01634791 Improved indirect phase reflection height measurement at panská ves — method, equipment, evaluation [Elektronische Daten] [Vladimír Fišer, Ivan Matys] Summary: Indirect phase reflection height measurements have been performed at the Panská Ves Observatory, Czechoslovakia, for 30 years to monitor solar flare effects (SFA). Only after introducing the new receiver in May 1985, could the indirect phase height analysis (IPHA) method be applied to measurements along the Allouis — Panská Ves 162 kHJ measuring path. The IPHA method allows the electron density and pressure variability in the lower ionosphere to be studied, particularly near the 80 km altitude. This paper describes the theoretical background of the IPHA method, the measuring equipment used at Panská Ves, the method of evaluating records and checking of data, and the program package developed by us both for graphic and numerical processing, as well as our efforts to develop a homogeneous East European IPHA network. The IPHA method has been introduced succesfully at the Panská Ves Observatory. Academia, Publishing House of the Czechoslovak Academy of Sciences, 1992 Fišer Vladimír Geophysical Institute, Czech. Acad. Sci., Prague aut Matys Ivan Geophysical Institute, Czech. Acad. Sci., Prague aut Studia Geophysica et Geodaetica Kluwer Academic Publishers 36/3(1992-09-01), 269-279 0039-3169 36:3<269 1992 36 11200 https://doi.org/10.1007/BF01634791 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF01634791 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Fišer Vladimír Geophysical Institute, Czech. Acad. Sci., Prague aut NATIONALLICENCE 700 1- Matys Ivan Geophysical Institute, Czech. Acad. Sci., Prague aut NATIONALLICENCE 773 0- Studia Geophysica et Geodaetica Kluwer Academic Publishers 36/3(1992-09-01), 269-279 0039-3169 36:3<269 1992 36 11200 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer