caa a22 4500 469113065 CHVBK 20180323133116.0 cr unu---uuuuu 170328e19920701xx s 000 0 eng 10.1007/BF02041675 doi (NATIONALLICENCE)springer-10.1007/BF02041675 The correction for γ-γ, γ-KX and γ-LX true-coincidences in k0-standardized NAA with counting in a LEPD [Elektronische Daten] [F. De Corte, M. Freitas] In order to calculate coincidence correction factors when measuring with a low-energy photon detector (LEPD), algorithms were developed for the description of the summing-out probabilities taking into account γ-LX in addition to γ-γ and γ-KX true-coincidences, where KX and LX can originate from internal conversion and electron capture. The accuracy of the calculation procedure is experimentally checked. The work presented here is part of an extension of the NAA k0-standardization to counting in a LEPD. Akadémiai Kiadó, 1992 De Corte F. Institute for Nuclear Sciences (INW), Gent University, Proeftuinstraat 86, B-9000, Gent, Belgium aut Freitas M. Laboratório Nacional de Engenharia e Technologia Industrial (LNETI/ICEN/DEEN), P-2685, Sacavém, Portugal aut Journal of Radioanalytical and Nuclear Chemistry Kluwer Academic Publishers 160/1(1992-07-01), 253-267 0236-5731 160:1<253 1992 160 10967 https://doi.org/10.1007/BF02041675 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02041675 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- De Corte F. Institute for Nuclear Sciences (INW), Gent University, Proeftuinstraat 86, B-9000, Gent, Belgium aut NATIONALLICENCE 700 1- Freitas M. Laboratório Nacional de Engenharia e Technologia Industrial (LNETI/ICEN/DEEN), P-2685, Sacavém, Portugal aut NATIONALLICENCE 773 0- Journal of Radioanalytical and Nuclear Chemistry Kluwer Academic Publishers 160/1(1992-07-01), 253-267 0236-5731 160:1<253 1992 160 10967 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer