caa a22 4500 469113154 CHVBK 20180323133117.0 cr unu---uuuuu 170328e19920701xx s 000 0 eng 10.1007/BF02041663 doi (NATIONALLICENCE)springer-10.1007/BF02041663 Radionuclide dating and trace element analysis by accelerator mass spectrometry [Elektronische Daten] [F. McDaniel, S. Matteson, D. Weathers, J. Duggan, D. Marble, I. Hassan, Z. Zhao, J. Anthony] Accelerator Mass Spectcrometry (AMS) is being used for both radionuclide dating and stable isotope trace element determination with limits of high sensitivity. The areas of applications of radionuclide AMS include oceanography, terrestrial studies, glaciology, hydrology, environmental studies, meteorology, archaeology, anthropology, analysis of crude oils, biomedical and materials sciences, etc. The techniques and applications of radionuclide AMS are reviewed. The applications of stable element AMS include the measurements of trace impurities in electronic and other materials. The techniques and applications of stable element AMS are discussed with particular emphasis on electronic materials such as Si, GaAs, and HgCdTe. The design of the University of North Texas stable element AMS facility built in collaboration with Texas Instruments Incorporated is discussed. Akadémiai Kiadó, 1992 McDaniel F. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut Matteson S. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut Weathers D. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut Duggan J. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut Marble D. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut Hassan I. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut Zhao Z. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut Anthony J. Central Research Laboratory, Texas Instruments Incorporated, M. S. 147, P.O. Box 655936, 75265-5936, Dallas, Texas, USA aut Journal of Radioanalytical and Nuclear Chemistry Kluwer Academic Publishers 160/1(1992-07-01), 119-140 0236-5731 160:1<119 1992 160 10967 https://doi.org/10.1007/BF02041663 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02041663 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- McDaniel F. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut NATIONALLICENCE 700 1- Matteson S. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut NATIONALLICENCE 700 1- Weathers D. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut NATIONALLICENCE 700 1- Duggan J. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut NATIONALLICENCE 700 1- Marble D. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut NATIONALLICENCE 700 1- Hassan I. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut NATIONALLICENCE 700 1- Zhao Z. Department of Physics and Center for Materials Characterization, University of North Texas, 76203-5368, Denton, Texas, USA aut NATIONALLICENCE 700 1- Anthony J. Central Research Laboratory, Texas Instruments Incorporated, M. S. 147, P.O. Box 655936, 75265-5936, Dallas, Texas, USA aut NATIONALLICENCE 773 0- Journal of Radioanalytical and Nuclear Chemistry Kluwer Academic Publishers 160/1(1992-07-01), 119-140 0236-5731 160:1<119 1992 160 10967 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer