caa a22 4500 469113324 CHVBK 20180323133117.0 cr unu---uuuuu 170328e19920701xx s 000 0 eng 10.1007/BF02037111 doi (NATIONALLICENCE)springer-10.1007/BF02037111 Technological innovations in high count-rate instrumentation [Elektronische Daten] [R. Seymour, S. Hinshaw, T. Nashabishi, C. Cox, B. Coyne, P. Sangsingkeow, W. Graves] Measurements at counting rates above 50,000 counts per second require specialized pulse processing electronics. New preamplifier technology incorporating an injection junction field effect transistor with integral reset gate provides superior throughput with better low energy resolution. Data acquisition at short peaking times permits maximum throughput with minimum pile-up. Over the past ten years, amplifier throughput of unpiled-up pulses improved. Now it is possible to correct the pulse amplitudes as they are processed, improving performance over older methods. Trapping and ballistic deficit are both greater in high rate measurements, where the shorter amplifier peaking times employed result in larger amplitude variations of the amplifier output pulse. Charge trapping may occur in any sized detector. The Goulding-Landis method corrects best for charge carrier trapping while the Hinshaw method works best for ballistic deficit effects. Akadémiai Kiadó, 1992 Seymour R. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut Hinshaw S. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut Nashabishi T. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut Cox C. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut Coyne B. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut Sangsingkeow P. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut Graves W. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut Journal of Radioanalytical and Nuclear Chemistry Kluwer Academic Publishers 160/2(1992-07-01), 363-370 0236-5731 160:2<363 1992 160 10967 https://doi.org/10.1007/BF02037111 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02037111 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Seymour R. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut NATIONALLICENCE 700 1- Hinshaw S. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut NATIONALLICENCE 700 1- Nashabishi T. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut NATIONALLICENCE 700 1- Cox C. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut NATIONALLICENCE 700 1- Coyne B. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut NATIONALLICENCE 700 1- Sangsingkeow P. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut NATIONALLICENCE 700 1- Graves W. Analytical Systems Division, Nuclear Measurements Group, Oxford Instruments, 601 Oak Ridge Turnpike, 37830-2560, Oak Ridge, TN, (USA) aut NATIONALLICENCE 773 0- Journal of Radioanalytical and Nuclear Chemistry Kluwer Academic Publishers 160/2(1992-07-01), 363-370 0236-5731 160:2<363 1992 160 10967 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer