caa a22 4500 469122617 CHVBK 20180323133143.0 cr unu---uuuuu 170328e19920501xx s 000 0 eng 10.1007/BF02368536 doi (NATIONALLICENCE)springer-10.1007/BF02368536 Electrode-electrolyte interface impedance: Experiments and model [Elektronische Daten] [J. Bates, Y. Chu] The impedance of the junction between a solid or aqueous electrolyte and a metal electrode at which no charge transfer processes occur (blocking contacts) follows closely the constant phase angle form, Z=A(jω)-n, over a wide frequency range, where A is a constant, and the frequency exponent n is typically in the range of 0.7 to 0.95. Several models have been proposed in which the magnitude of the frequency exponent n is related by a simple expression to the fractal dimension $$\bar d$$ of the rough electrode surface. But experiments with aqueous H2SO4 and roughened platinum and silicon electrodes show that there is no simple relationship, if any at all, between n and $$\bar d$$ when $$\bar d$$ is determined from the analysis of one dimensional surface profiles. Moreover, n is not a simple function of the average roughness of the electrode. In order to gain some insight into the effect of electrode topography and the interface impedance, a model for the response of the interface to a constant voltage pulse was constructed. This model is based on the idea that, following a pulse, locally concentrated regions of ions accumulate rapidly at the tips of large protrusions on the electrode surface which screens deeper regions of the electrode from the field driven flux of mobile ions. After this rapid charging, ions are able to reach the deeper, screened regions of the electrode by diffusion, and it is this diffusive process that gives rise to the observed t1−n dependence of the charge collected. Computer simulations, similar to the diffusion limited aggregation model, using measured profiles as fixed (non-growing) clusters, gave exponents n in good agreement with experiment. Pergamon Press Ltd., 1992 Electrode-electrolyte interface nationallicence Impedance nationallicence Simulation nationallicence Bates J. Solid State Division, Oak Ridge National Laboratory, 37830, Oak Ridge, TN aut Chu Y. Solid State Division, Oak Ridge National Laboratory, 37830, Oak Ridge, TN aut Annals of Biomedical Engineering Kluwer Academic Publishers 20/3(1992-05-01), 349-362 0090-6964 20:3<349 1992 20 10439 https://doi.org/10.1007/BF02368536 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02368536 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Bates J. Solid State Division, Oak Ridge National Laboratory, 37830, Oak Ridge, TN aut NATIONALLICENCE 700 1- Chu Y. Solid State Division, Oak Ridge National Laboratory, 37830, Oak Ridge, TN aut NATIONALLICENCE 773 0- Annals of Biomedical Engineering Kluwer Academic Publishers 20/3(1992-05-01), 349-362 0090-6964 20:3<349 1992 20 10439 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer