caa a22 4500 469124539 CHVBK 20180323133147.0 cr unu---uuuuu 170328e19920601xx s 000 0 eng 10.1007/BF00035191 doi (NATIONALLICENCE)springer-10.1007/BF00035191 An elastic-plastic finite element analysis of a blunting interface crack with microvoid damage [Elektronische Daten] [Shigeru Aoki, Kikuo Kishimoto, Noriyasu Takeuchi] A finite strain elastic-plastic finite element analysis is performed on a crack which lies on an interface between two dissimilar materials. The materials above and below the interface are assumed to be different from each other in yield stress or in strain-hardening exponent. Gurson's constitutive equation for porous plastic materials is used in order to take into account the effect of the microvoid nucleation and growth on the fields near the tip of a crack. It is found that the microvoids have larger effects on the crack tip blunting and stress fields for a bimaterial than for a homogeneous material. It is also found that the plastic strain and the microvoid volume fraction localize in a few narrow bands which grow into the softer material from the intersection of the interface and the blunted crack tip at inclinations of about 15° ∼ 45°. Kluwer Academic Publishers, 1992 Aoki Shigeru Tokyo Institute of Technology, O-okayama, Meguro-ku, 152, Tokyo, Japan aut Kishimoto Kikuo Tokyo Institute of Technology, O-okayama, Meguro-ku, 152, Tokyo, Japan aut Takeuchi Noriyasu Imaging Technology Research Center, Ricoh Company, Ltd., 1-3-6 Nakamagome, Oota-ky, 143, Tokyo, Japan aut International Journal of Fracture Kluwer Academic Publishers 55/4(1992-06-01), 363-374 0376-9429 55:4<363 1992 55 10704 https://doi.org/10.1007/BF00035191 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00035191 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Aoki Shigeru Tokyo Institute of Technology, O-okayama, Meguro-ku, 152, Tokyo, Japan aut NATIONALLICENCE 700 1- Kishimoto Kikuo Tokyo Institute of Technology, O-okayama, Meguro-ku, 152, Tokyo, Japan aut NATIONALLICENCE 700 1- Takeuchi Noriyasu Imaging Technology Research Center, Ricoh Company, Ltd., 1-3-6 Nakamagome, Oota-ky, 143, Tokyo, Japan aut NATIONALLICENCE 773 0- International Journal of Fracture Kluwer Academic Publishers 55/4(1992-06-01), 363-374 0376-9429 55:4<363 1992 55 10704 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer