caa a22 4500 469129697 CHVBK 20180323133201.0 cr unu---uuuuu 170328e19920301xx s 000 0 eng 10.1007/BF00325119 doi (NATIONALLICENCE)springer-10.1007/BF00325119 Laser ionization mass spectrometry in inorganic trace analysis [Elektronische Daten] [J. Becker, H. Dietze] Summary: Among the different spectrometric techniques for trace analysis Laser Ionization Mass Spectrometry (LIMS) is well established as a trace analytical method. With the LIMS technique the sample material is evaporated and ionized by means of a focused pulsed laser in a laser microplasma, which is formed in the spot area of the irradiated sample. All chemical elements in the sample materials are evaporated and ionized in the laser plasma. The ions formed are separated according to their mass and energy by a time-of-flight, quadrupole or double focusing mass spectrometer. In this review the characteristics and analytical features, some recent developments and applications of laser ionization mass spectrometry in inorganic trace analysis are described. Springer-Verlag, 1992 Becker J. Zentralabteilung für Chemische Analysen, Forschungszentrum Jülich GmbH, W-5170, Jülich 1, Federal Republic of Germany aut Dietze H. Zentralabteilung für Chemische Analysen, Forschungszentrum Jülich GmbH, W-5170, Jülich 1, Federal Republic of Germany aut Fresenius' Journal of Analytical Chemistry Springer-Verlag 344/3(1992-03-01), 69-86 0937-0633 344:3<69 1992 344 216 https://doi.org/10.1007/BF00325119 text/html Onlinezugriff via DOI 1 review-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00325119 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Becker J. Zentralabteilung für Chemische Analysen, Forschungszentrum Jülich GmbH, W-5170, Jülich 1, Federal Republic of Germany aut NATIONALLICENCE 700 1- Dietze H. Zentralabteilung für Chemische Analysen, Forschungszentrum Jülich GmbH, W-5170, Jülich 1, Federal Republic of Germany aut NATIONALLICENCE 773 0- Fresenius' Journal of Analytical Chemistry Springer-Verlag 344/3(1992-03-01), 69-86 0937-0633 344:3<69 1992 344 216 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer