Sensitivity of surface resistance measurement of HTS thin films by cavity resonator, dielectric resonator and microstrip line resonator

Verfasser / Beitragende:
[N Kataria, Mukul Misra, R Pinto]
Ort, Verlag, Jahr:
2002
Enthalten in:
Pramana, 58/5-6(2002-05-01), 1171-1177
Format:
Artikel (online)
ID: 471130923