Low-resistance Ti/Al ohmic contact on undoped ZnO

Verfasser / Beitragende:
[Soo Young Kim, Ho Won Jang, Jong Kyu Kim, Chang Min Jeon, Won Il Park, Gyu-Chul Yi, Jong-Lam Lee]
Ort, Verlag, Jahr:
2002
Enthalten in:
Journal of Electronic Materials, 31/8(2002-08-01), 868-871
Format:
Artikel (online)
ID: 471148431