<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>     caa a22        4500</leader>
  <controlfield tag="001">475791975</controlfield>
  <controlfield tag="003">CHVBK</controlfield>
  <controlfield tag="005">20180406123713.0</controlfield>
  <controlfield tag="007">cr unu---uuuuu</controlfield>
  <controlfield tag="008">170329e20000201xx      s     000 0 eng  </controlfield>
  <datafield tag="024" ind1="7" ind2="0">
   <subfield code="a">10.1007/s005420050001</subfield>
   <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/s005420050001</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
   <subfield code="a">Manufacturing technologies for miniaturized interference filters</subfield>
   <subfield code="h">[Elektronische Daten]</subfield>
   <subfield code="c">[M. Frank, N. Kaiser]</subfield>
  </datafield>
  <datafield tag="520" ind1="3" ind2=" ">
   <subfield code="a"> Miniaturized interference filters were designed and fabricated using two different manufacturing technologies. Applying micromachined ceramic masks during the coating processes interference filters with 1 mm lateral feature size and an alignment accuracy of 50 μm were arranged in an array consisting of three different filters. The filter edge definition obtained by this method was smaller than 50 μm. By applying ion assisted deposition (IAD), a low-temperature coating process, the spectral sensitivity of receiver cells has been modified by coating the cells directly. A combination of coating processes, microlithographic masking procedures, and dry etching technologies made it possible to arrange three different stripe filters with minimum filter features of about 5 μm side by side. The accuracy during mask alignment and the filter edge definition was also within 1 and 2 μm, respectively.</subfield>
  </datafield>
  <datafield tag="540" ind1=" " ind2=" ">
   <subfield code="a">Springer-Verlag Berlin Heidelberg, 2000</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Frank</subfield>
   <subfield code="D">M.</subfield>
   <subfield code="u">Fraunhofer Institut für Angewandte Optik und Feinmechanik Schillerstraße 1, D-07745 Jena, Germany, DE</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Kaiser</subfield>
   <subfield code="D">N.</subfield>
   <subfield code="u">Fraunhofer Institut für Angewandte Optik und Feinmechanik Schillerstraße 1, D-07745 Jena, Germany, DE</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="u">https://doi.org/10.1007/s005420050001</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="908" ind1=" " ind2=" ">
   <subfield code="D">1</subfield>
   <subfield code="a">research-article</subfield>
   <subfield code="2">jats</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/s005420050001</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Frank</subfield>
   <subfield code="D">M.</subfield>
   <subfield code="u">Fraunhofer Institut für Angewandte Optik und Feinmechanik Schillerstraße 1, D-07745 Jena, Germany, DE</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Kaiser</subfield>
   <subfield code="D">N.</subfield>
   <subfield code="u">Fraunhofer Institut für Angewandte Optik und Feinmechanik Schillerstraße 1, D-07745 Jena, Germany, DE</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="900" ind1=" " ind2="7">
   <subfield code="a">Metadata rights reserved</subfield>
   <subfield code="b">Springer special CC-BY-NC licence</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="898" ind1=" " ind2=" ">
   <subfield code="a">BK010053</subfield>
   <subfield code="b">XK010053</subfield>
   <subfield code="c">XK010000</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
 </record>
</collection>
