caa a22 4500 47580810X CHVBK 20180406123752.0 cr unu---uuuuu 170329e20000601xx s 000 0 eng 10.1007/BF02503546 doi (NATIONALLICENCE)springer-10.1007/BF02503546 Bogomol'nyi V. aut Resonance calculation for electrothermal damage to metal-insulator-metal structures [Elektronische Daten] [V. Bogomol'nyi] A thermal fluctuation theory has been developed for damage to metal-insulator-metal diode structures, which has been employed to determine the critical electrophysical parameters for oscillating structural changes arising in the insulator in a steady external electric field. The electronic processes giving rise to microdefects are of autowave origin and are accompanied by current oscillations, acoustic emission, and electromagnetic radiation. This can be used in remote-sensing nondestructive testing, and also for the elimination of manufacturing defects in solid-state electronic devices and the insulation in electrotechnical instruments. Kluwer Academic/Plenum Publishers, 2000 Measurement Techniques Kluwer Academic Publishers-Plenum Publishers 43/6(2000-06-01), 538-543 0543-1972 43:6<538 2000 43 11018 https://doi.org/10.1007/BF02503546 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02503546 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Bogomol'nyi V. aut NATIONALLICENCE 773 0- Measurement Techniques Kluwer Academic Publishers-Plenum Publishers 43/6(2000-06-01), 538-543 0543-1972 43:6<538 2000 43 11018 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer