caa a22 4500 475821955 CHVBK 20180406123821.0 cr unu---uuuuu 170329e20001201xx s 000 0 eng 10.1023/A:1011307814598 doi (NATIONALLICENCE)springer-10.1023/A:1011307814598 Special Features of Local Photoelectrical Properties of Inhomogeneous Metal-Insulator-Semiconductor Structures [Elektronische Daten] [A. Voitsekhovskii, S. Nesmelov, O. Lanskaya, E. Lilenko] Local photoelectrical measurements are used to study anomalous electrical properties of metal-insulator-semiconductor structures (decrease in photoemf in inversion). The inhomogeneous surface potential in the gap between the regions beneath and behind the electrode and between different parts of the region beneath the electrode may lead to a decrease in the local photoemf in inversion. Plenum Publishing Corporation, 2000 Voitsekhovskii A. Siberian Physicotechnical Institute, Tomsk State University, Russia aut Nesmelov S. Siberian Physicotechnical Institute, Tomsk State University, Russia aut Lanskaya O. Siberian Physicotechnical Institute, Tomsk State University, Russia aut Lilenko E. Siberian Physicotechnical Institute, Tomsk State University, Russia aut Russian Physics Journal Kluwer Academic Publishers-Plenum Publishers 43/12(2000-12-01), 1020-1022 1064-8887 43:12<1020 2000 43 11182 https://doi.org/10.1023/A:1011307814598 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1023/A:1011307814598 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Voitsekhovskii A. Siberian Physicotechnical Institute, Tomsk State University, Russia aut NATIONALLICENCE 700 1- Nesmelov S. Siberian Physicotechnical Institute, Tomsk State University, Russia aut NATIONALLICENCE 700 1- Lanskaya O. Siberian Physicotechnical Institute, Tomsk State University, Russia aut NATIONALLICENCE 700 1- Lilenko E. Siberian Physicotechnical Institute, Tomsk State University, Russia aut NATIONALLICENCE 773 0- Russian Physics Journal Kluwer Academic Publishers-Plenum Publishers 43/12(2000-12-01), 1020-1022 1064-8887 43:12<1020 2000 43 11182 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer