caa a22 4500 477041671 CHVBK 20180405111319.0 cr unu---uuuuu 170330e19960601xx s 000 0 eng 10.1007/BF02369819 doi (NATIONALLICENCE)springer-10.1007/BF02369819 Invariants in metrology and technical diagnostics [Elektronische Daten] [L. Mironovskii, V. Slaev] The interrelationship between metrology and technical diagnostics is analyzed. Parallels are noted in the ideas, concepts, and metrological and diagnostic procedures, including aims, objects, models, parameters, methods, apparatus, processing, and estimation of results. It is found to be promising to utilize the theory of invariants in metrology and technical diagnostics. Different types of invariant are given for linear dynamic systems. Plenum Publishing Corporation, 1996 Mironovskii L. aut Slaev V. aut Measurement Techniques Kluwer Academic Publishers-Plenum Publishers 39/6(1996-06-01), 577-593 0543-1972 39:6<577 1996 39 11018 https://doi.org/10.1007/BF02369819 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02369819 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Mironovskii L. aut NATIONALLICENCE 700 1- Slaev V. aut NATIONALLICENCE 773 0- Measurement Techniques Kluwer Academic Publishers-Plenum Publishers 39/6(1996-06-01), 577-593 0543-1972 39:6<577 1996 39 11018 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer