caa a22 4500 477043127 CHVBK 20180405111323.0 cr unu---uuuuu 170330e19960801xx s 000 0 eng 10.1007/BF02370193 doi (NATIONALLICENCE)springer-10.1007/BF02370193 Trusov V. aut Measuring the relationship between temperature and the electrical properties of films on titanium [Elektronische Daten] [V. Trusov] We investigate the influence of ambient temperature on changes in the resistivity, dielectric permeability, and breakdown voltage of insulating layers on the contact plates of microdevices grown on titanium substrates. We consider possible mechanisms for conductivity and polarization in the insulating layer. Plenum Publishing Corporation, 1997 Measurement Techniques Kluwer Academic Publishers-Plenum Publishers 39/8(1996-08-01), 811-813 0543-1972 39:8<811 1996 39 11018 https://doi.org/10.1007/BF02370193 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02370193 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Trusov V. aut NATIONALLICENCE 773 0- Measurement Techniques Kluwer Academic Publishers-Plenum Publishers 39/8(1996-08-01), 811-813 0543-1972 39:8<811 1996 39 11018 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer