caa a22 4500 477043321 CHVBK 20180405111323.0 cr unu---uuuuu 170330e19960501xx s 000 0 eng 10.1007/BF02375754 doi (NATIONALLICENCE)springer-10.1007/BF02375754 Sequential discrete multilevel automated system for recording electron-diffraction patterns [Elektronische Daten] [A. Grigor'ev, A. Drzhevetskii, X. Orekhov] This article considers a discrete sequential multilevel automated system for recording electron-diffraction patterns. A comparative analysis is presented, along with experimental results that make it possible to evaluate the effectiveness of the technical decisions on which the device is based. The general design of the system is presented. Plenum Publishing Corporation, 1996 Grigor'ev A. aut Drzhevetskii A. aut Orekhov X. aut Measurement Techniques Kluwer Academic Publishers-Plenum Publishers 39/5(1996-05-01), 483-486 0543-1972 39:5<483 1996 39 11018 https://doi.org/10.1007/BF02375754 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02375754 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Grigor'ev A. aut NATIONALLICENCE 700 1- Drzhevetskii A. aut NATIONALLICENCE 700 1- Orekhov X. aut NATIONALLICENCE 773 0- Measurement Techniques Kluwer Academic Publishers-Plenum Publishers 39/5(1996-05-01), 483-486 0543-1972 39:5<483 1996 39 11018 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer