caa a22 4500 477043437 CHVBK 20180405111324.0 cr unu---uuuuu 170330e19960501xx s 000 0 eng 10.1007/BF02375755 doi (NATIONALLICENCE)springer-10.1007/BF02375755 Investigation of the influence of boundary effects on the stability and TCR of thin-film resistors [Elektronische Daten] [R. Avanesyan, Yu. Lazarev, A. Lugin, A. Tartakovskii] Physical effects at the interface between the resistor element and the terminals and at the interface between the resistor element and the base, and on the surface of the resistor layer are considered. The influence of these effects on the stability and temperature coefficient of resistance of thin-film resistors with range of resistances from 10 to 107 ω is shown. Plenum Publishing Corporation, 1996 Avanesyan R. aut Lazarev Yu aut Lugin A. aut Tartakovskii A. aut Measurement Techniques Kluwer Academic Publishers-Plenum Publishers 39/5(1996-05-01), 487-490 0543-1972 39:5<487 1996 39 11018 https://doi.org/10.1007/BF02375755 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02375755 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Avanesyan R. aut NATIONALLICENCE 700 1- Lazarev Yu aut NATIONALLICENCE 700 1- Lugin A. aut NATIONALLICENCE 700 1- Tartakovskii A. aut NATIONALLICENCE 773 0- Measurement Techniques Kluwer Academic Publishers-Plenum Publishers 39/5(1996-05-01), 487-490 0543-1972 39:5<487 1996 39 11018 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer