caa a22 4500 477058825 CHVBK 20180405111354.0 cr unu---uuuuu 170330e19960601xx s 000 0 eng 10.1007/BF02437024 doi (NATIONALLICENCE)springer-10.1007/BF02437024 Temperature dependence of the dielectric strength of zinc sulfide films [Elektronische Daten] [A. Zhigal'skii, L. Ikonnikova, T. Minakova, V. Mukhachev, P. Troyan] The temperature dependence of the dielectric strength Epn of ZnS:Mn films produced by high-frequency magnetron sputtering was investigated in the range T=20-200°C. It is shown that processes associated with removal of adsorbed water from the ZnS:Mn films are responsible for the maximum on the Epn=f(T) curve. Data on the temperature dependence of the capacitance and loss-angle are given for thin-film systems based on ZnS:Mn. Plenum Publishing Corporation, 1996 Zhigal'skii A. aut Ikonnikova L. aut Minakova T. aut Mukhachev V. aut Troyan P. aut Russian Physics Journal Kluwer Academic Publishers-Consultants Bureau 39/6(1996-06-01), 576-578 1064-8887 39:6<576 1996 39 11182 https://doi.org/10.1007/BF02437024 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02437024 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Zhigal'skii A. aut NATIONALLICENCE 700 1- Ikonnikova L. aut NATIONALLICENCE 700 1- Minakova T. aut NATIONALLICENCE 700 1- Mukhachev V. aut NATIONALLICENCE 700 1- Troyan P. aut NATIONALLICENCE 773 0- Russian Physics Journal Kluwer Academic Publishers-Consultants Bureau 39/6(1996-06-01), 576-578 1064-8887 39:6<576 1996 39 11182 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer