caa a22 4500 477097626 CHVBK 20180405111532.0 cr unu---uuuuu 170330e19960701xx s 000 0 eng 10.1007/BF02996025 doi (NATIONALLICENCE)springer-10.1007/BF02996025 Noise of a single-ion frequency standard [Elektronische Daten] [Peter Toschek, Bernd Appasamy, Philippe Courteille, Ralf Huesmann, Yves Stalgies] Bruit D'un Étalon de FrÉquence À ion Unique A frequency source supposed to serve as a standard requires feedback for short-term and long-term frequency control. A spectral discriminant for short-term control may be provided, in the microwave regime, by a hyperfine resonance of a multi-ion ensemble confined in an electrodynamic trap, and in the optical regime by an eigenmode of a focal Fabry-Pérot cavity. For long-term frequency control, resonances of single trapped ions are discriminants of superior accuracy although the controlled frequency shows random fluctuations caused by noise on the feedback signal. Its fundamental contribution is quantum projection noise. The detection of fluorescence for the generation of feedback is incompatible with the ions being prepared in a superposition state in the excitation by the wave emitted from the oscillator. Attempts of circumventing this limitation by preparing ensembles of correlated ions prior to the measurement (spin squeezing) are reviewed. Institut Telecom / Springer-Verlag France, 1996 Frequency standard nationallicence Frequency control nationallicence Optical resonator nationallicence Short term nationallicence Long term nationallicence Frequency stability nationallicence Ion trapping nationallicence Multiple resonance nationallicence Quantum effect nationallicence Etalon fréquence nationallicence Commande fréquence nationallicence Résonateur optique nationallicence Court terme nationallicence Long terme nationallicence Stabilité fréquence nationallicence Piégeage ion nationallicence Résonance multiple nationallicence Effet quantique nationallicence Toschek Peter Institut für Laser-Physik, Universität Hamburg, Jungiusstraße 9, D-20355, Hamburg, Germany aut Appasamy Bernd Institut für Laser-Physik, Universität Hamburg, Jungiusstraße 9, D-20355, Hamburg, Germany aut Courteille Philippe Institut für Laser-Physik, Universität Hamburg, Jungiusstraße 9, D-20355, Hamburg, Germany aut Huesmann Ralf Institut für Laser-Physik, Universität Hamburg, Jungiusstraße 9, D-20355, Hamburg, Germany aut Stalgies Yves Institut für Laser-Physik, Universität Hamburg, Jungiusstraße 9, D-20355, Hamburg, Germany aut Annales Des Télécommunications Springer-Verlag 51/7-8(1996-07-01), 373-382 0003-4347 51:7-8<373 1996 51 12243 https://doi.org/10.1007/BF02996025 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02996025 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Toschek Peter Institut für Laser-Physik, Universität Hamburg, Jungiusstraße 9, D-20355, Hamburg, Germany aut NATIONALLICENCE 700 1- Appasamy Bernd Institut für Laser-Physik, Universität Hamburg, Jungiusstraße 9, D-20355, Hamburg, Germany aut NATIONALLICENCE 700 1- Courteille Philippe Institut für Laser-Physik, Universität Hamburg, Jungiusstraße 9, D-20355, Hamburg, Germany aut NATIONALLICENCE 700 1- Huesmann Ralf Institut für Laser-Physik, Universität Hamburg, Jungiusstraße 9, D-20355, Hamburg, Germany aut NATIONALLICENCE 700 1- Stalgies Yves Institut für Laser-Physik, Universität Hamburg, Jungiusstraße 9, D-20355, Hamburg, Germany aut NATIONALLICENCE 773 0- Annales Des Télécommunications Springer-Verlag 51/7-8(1996-07-01), 373-382 0003-4347 51:7-8<373 1996 51 12243 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer