caa a22 4500 477123988 CHVBK 20180405111644.0 cr unu---uuuuu 170330e19971001xx s 000 0 eng 10.1007/BF02678353 doi (NATIONALLICENCE)springer-10.1007/BF02678353 Advanced setup for measurement of a surface impedance of a HTSC films in a millimeter wave range [Elektronische Daten] [I. Voinovsky, O. Poustylnik] In the article a method of measurement of a surface impedance Zs of flat HTSC samples and setup realized on its basis is considered. The method is based on use of the copper cylindrical cavity, raised on the H011 mode, in which the researched sample replaces one of butt-end wall. Ideas realized in setup have allowed to reach practically limiting characteristics on a range and accuracy of measurement of value Zs, for a chosen method of measurements. Plenum Publishing Corporation, 1997 Voinovsky I. The State Research Center, Fonon, 37 Peremogy Avenue, KPI-3240, Kiev, Ukraine aut Poustylnik O. The State Research Center, Fonon, 37 Peremogy Avenue, KPI-3240, Kiev, Ukraine aut International Journal of Infrared and Millimeter Waves Kluwer Academic Publishers-Plenum Publishers 18/10(1997-10-01), 1927-1935 0195-9271 18:10<1927 1997 18 10762 https://doi.org/10.1007/BF02678353 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02678353 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Voinovsky I. The State Research Center, Fonon, 37 Peremogy Avenue, KPI-3240, Kiev, Ukraine aut NATIONALLICENCE 700 1- Poustylnik O. The State Research Center, Fonon, 37 Peremogy Avenue, KPI-3240, Kiev, Ukraine aut NATIONALLICENCE 773 0- International Journal of Infrared and Millimeter Waves Kluwer Academic Publishers-Plenum Publishers 18/10(1997-10-01), 1927-1935 0195-9271 18:10<1927 1997 18 10762 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer