caa a22 4500 477124232 CHVBK 20180405111645.0 cr unu---uuuuu 170330e19970801xx s 000 0 eng 10.1007/BF02678312 doi (NATIONALLICENCE)springer-10.1007/BF02678312 Measurements of the sideband conversion gain ratio of a millimeter-wave heterodyne sub-harmonic mixer using a fourier transform spectrometer [Elektronische Daten] [M. Oldfield, B. Ellison, B. Maddison, C. Mann, B. Moyna, D. Matheson] A Fourier transform spectrometer, based on a Martin-Puplett polarisation rotation interferometer and using broad-band blackbody noise sources, has been used to study the sideband response i.e., conversion gain, of a room temperature Schottky diode sub-harmonic mixer operating at 300 GHz. The technique enables the response of the mixer to be characterised and preferentially tuned to one sideband, thereby improving the rejection of unwanted spectral components which can be present in the mixer image sideband. Plenum Publishing Corporation, 1997 Sideband Ratio nationallicence Fourier Transform Spectrometer nationallicence Oldfield M. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut Ellison B. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut Maddison B. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut Mann C. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut Moyna B. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut Matheson D. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut International Journal of Infrared and Millimeter Waves Kluwer Academic Publishers-Plenum Publishers 18/8(1997-08-01), 1547-1563 0195-9271 18:8<1547 1997 18 10762 https://doi.org/10.1007/BF02678312 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02678312 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Oldfield M. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut NATIONALLICENCE 700 1- Ellison B. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut NATIONALLICENCE 700 1- Maddison B. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut NATIONALLICENCE 700 1- Mann C. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut NATIONALLICENCE 700 1- Moyna B. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut NATIONALLICENCE 700 1- Matheson D. Millimeter-Wave Technology Group, Rutherford Appleton Laboratory, OX11 0QX, Chilton, Didcot, Oxon., United Kingdom aut NATIONALLICENCE 773 0- International Journal of Infrared and Millimeter Waves Kluwer Academic Publishers-Plenum Publishers 18/8(1997-08-01), 1547-1563 0195-9271 18:8<1547 1997 18 10762 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer