naa a22 4500 510729215 CHVBK 20180411082946.0 cr unu---uuuuu 180411e20130901xx s 000 0 eng 10.1007/s12200-013-0341-y doi (NATIONALLICENCE)springer-10.1007/s12200-013-0341-y Quality assessment method for geometrically distorted images [Elektronische Daten] [Binbing Liu, Ming Zhao, Haiqing Chen] The objective assessment of image quality is important for image processing, which has been paid much attention to in recent years. However, there were few reports about objective quality assessment methods for geometrically distorted images. Different from the routine image degradation processing (for example, noise addition, contrast change and lossy compression), the geometric distortion results in the changes of the spatial relationship of image pixels, which makes the traditional quality assessment algorithms, such as mean square error (MSE) and peak signal to noise ratio (PSNR) failure to obtain expected assessment results. In this paper, a full reference image quality assessment algorithm is proposed specifically for the quality evaluation of geometrically distorted images. This assessment algorithm takes into account three key factors, such as distortion intensity, distortion change rate and line feature index for perceptual quality assessment of images. Experimental results in this study show that the proposed assessment algorithm not only is significantly better than those of the traditional objective assessment methods such as PSNR and structural similarity index measurement (SSIM), but also has significant correlation with human subjective assessment. Higher Education Press and Springer-Verlag Berlin Heidelberg, 2013 image quality assessment nationallicence geometrical distortion nationallicence displacement vector field nationallicence line feature index nationallicence Hough transform nationallicence Liu Binbing School of Optical and Electronics Information, Huazhong University of Science and Technology, 430074, Wuhan, China aut Zhao Ming School of Optical and Electronics Information, Huazhong University of Science and Technology, 430074, Wuhan, China aut Chen Haiqing School of Optical and Electronics Information, Huazhong University of Science and Technology, 430074, Wuhan, China aut Frontiers of Optoelectronics Springer Berlin Heidelberg 6/3(2013-09-01), 275-281 2095-2759 6:3<275 2013 6 12200 https://doi.org/10.1007/s12200-013-0341-y text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s12200-013-0341-y text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Liu Binbing School of Optical and Electronics Information, Huazhong University of Science and Technology, 430074, Wuhan, China aut NATIONALLICENCE 700 1- Zhao Ming School of Optical and Electronics Information, Huazhong University of Science and Technology, 430074, Wuhan, China aut NATIONALLICENCE 700 1- Chen Haiqing School of Optical and Electronics Information, Huazhong University of Science and Technology, 430074, Wuhan, China aut NATIONALLICENCE 773 0- Frontiers of Optoelectronics Springer Berlin Heidelberg 6/3(2013-09-01), 275-281 2095-2759 6:3<275 2013 6 12200 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer