naa a22 4500 510767141 CHVBK 20180411083200.0 cr unu---uuuuu 180411e20130501xx s 000 0 eng 10.1007/s12043-013-0528-1 doi (NATIONALLICENCE)springer-10.1007/s12043-013-0528-1 Nanoscale experimental study of the morphology of a microcrack in silicon by transmission electron microscopy [Elektronische Daten] [D LIU, C ZHAO, X HOU] A microcrack in a silicon single crystal was experimentally investigated using high-resolution transmission electron microscopy (HRTEM). In particular, the numerical Moiré (NM) method was used to visualize the deformations and defects. The lattice structure of the microcrack was carefully observed at the nanoscale. HRTEM images of the microcrack demonstrated that the lattice structure of most of the microcrack regions is regular with good periodicity. In addition, the microcrack cleavage expands alternately along different crystal planes, where the principal cleavage plane is the (1 1 1) crystal plane. The NM maps showed no sharp plastic deformation around the microcrack, but discrete edge dislocations can be found only near the crack tip. Indian Academy of Sciences, 2013 Microcrack nationallicence high-resolution transmission electron microscopy nationallicence numerical Moiré nationallicence cleavage plane nationallicence LIU D. Communications and Electronics Engineering Institute, Qiqihar University, 161006, Qiqihar, China aut ZHAO C. College of Science, Inner Mongolia University of Technology, 010051, Hohhot, China aut HOU X. Test Center, Inner Mongolia University of Technology, 010051, Hohhot, China aut Pramana Springer-Verlag 80/5(2013-05-01), 903-907 0304-4289 80:5<903 2013 80 12043 https://doi.org/10.1007/s12043-013-0528-1 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s12043-013-0528-1 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- LIU D. Communications and Electronics Engineering Institute, Qiqihar University, 161006, Qiqihar, China aut NATIONALLICENCE 700 1- ZHAO C. College of Science, Inner Mongolia University of Technology, 010051, Hohhot, China aut NATIONALLICENCE 700 1- HOU X. Test Center, Inner Mongolia University of Technology, 010051, Hohhot, China aut NATIONALLICENCE 773 0- Pramana Springer-Verlag 80/5(2013-05-01), 903-907 0304-4289 80:5<903 2013 80 12043 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer