naa a22 4500 510770185 CHVBK 20180411083210.0 cr unu---uuuuu 180411e20130901xx s 000 0 eng 10.1007/s11837-013-0685-1 doi (NATIONALLICENCE)springer-10.1007/s11837-013-0685-1 Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells [Elektronische Daten] [D. Abou-Ras, J. Kavalakkatt, M. Nichterwitz, N. Schäfer, S. Harndt, A. Wilkinson, K. Tsyrulin, H. Schulz, F. Bauer] The present work gives an overview of the application of electron backscatter diffraction (EBSD) in the field of thin-film solar cells, which consist of stacks of polycrystalline layers on various rigid or flexible substrates. EBSD provides access to grain-size and local-orientation distributions, film textures, and grain-boundary types. By evaluation of the EBSD patterns within individual grains of the polycrystalline solar cell layers, microstrain distributions also can be obtained. These microstructural properties are of considerable interest for research and development of thin-film solar cells. Moreover, EBSD may be performed three-dimensionally, by alternating slicing of cross sections in a focused ion-beam machine and EBSD acquisition. To relate the microstructural properties to the electrical properties of individual layers as well as to the device performances of corresponding solar cells, EBSD can be combined with electron-beam-induced current and cathodoluminescence measurements and with various scanning-probe microscopy methods such as Kelvin-probe force, scanning spreading resistance, or scanning capacitance microscopy on identical specimen positions. Together with standard device characterization of thin-film solar cells, these scanning microscopy measurements provide the means for extensive analysis of structure-property relationships in solar-cell stacks with polycrystalline layers. TMS, 2013 Abou-Ras D. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109, Berlin, Germany aut Kavalakkatt J. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109, Berlin, Germany aut Nichterwitz M. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109, Berlin, Germany aut Schäfer N. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109, Berlin, Germany aut Harndt S. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109, Berlin, Germany aut Wilkinson A. Department of Materials, University of Oxford, Parks Road, OX1 3PH, Oxford, UK aut Tsyrulin K. Carl Zeiss Microscopy GmbH, Carl-Zeiss-Strasse 56, 73447, Oberkochen, Germany aut Schulz H. Carl Zeiss Microscopy GmbH, Carl-Zeiss-Strasse 56, 73447, Oberkochen, Germany aut Bauer F. Oxford Instruments GmbH, NanoAnalysis, Otto-von-Guericke-Ring 10, 65205, Wiesbaden, Germany aut JOM Springer US; http://www.springer-ny.com 65/9(2013-09-01), 1222-1228 1047-4838 65:9<1222 2013 65 11837 https://doi.org/10.1007/s11837-013-0685-1 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11837-013-0685-1 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Abou-Ras D. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109, Berlin, Germany aut NATIONALLICENCE 700 1- Kavalakkatt J. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109, Berlin, Germany aut NATIONALLICENCE 700 1- Nichterwitz M. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109, Berlin, Germany aut NATIONALLICENCE 700 1- Schäfer N. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109, Berlin, Germany aut NATIONALLICENCE 700 1- Harndt S. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109, Berlin, Germany aut NATIONALLICENCE 700 1- Wilkinson A. Department of Materials, University of Oxford, Parks Road, OX1 3PH, Oxford, UK aut NATIONALLICENCE 700 1- Tsyrulin K. Carl Zeiss Microscopy GmbH, Carl-Zeiss-Strasse 56, 73447, Oberkochen, Germany aut NATIONALLICENCE 700 1- Schulz H. Carl Zeiss Microscopy GmbH, Carl-Zeiss-Strasse 56, 73447, Oberkochen, Germany aut NATIONALLICENCE 700 1- Bauer F. Oxford Instruments GmbH, NanoAnalysis, Otto-von-Guericke-Ring 10, 65205, Wiesbaden, Germany aut NATIONALLICENCE 773 0- JOM Springer US; http://www.springer-ny.com 65/9(2013-09-01), 1222-1228 1047-4838 65:9<1222 2013 65 11837 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer