naa a22 4500 510770231 CHVBK 20180411083211.0 cr unu---uuuuu 180411e20130901xx s 000 0 eng 10.1007/s11837-013-0700-6 doi (NATIONALLICENCE)springer-10.1007/s11837-013-0700-6 Suzuki Seiichi TSL Solutions KK, #SIC2-401, 5-4-30, Nishihashimoto, Midori-Ku, 252-0131, Kanagawa, Sagamihara, Japan aut Features of Transmission EBSD and its Application [Elektronische Daten] [Seiichi Suzuki] Features of transmission electron backscatter diffraction (EBSD) observation with a standard EBSD (s-EBSD) detector are surveyed in this study. Heavily deformed Al and 8Cr tempered martensite transmission electron microscope (TEM) specimens were used for this study. It is shown that a specimen tilt angle of ~30°-40° in the opposite direction of the usual 70° and a smaller working distance in the range 4mm-5mm are recommended when using a s-EBSD detector. Specimen thickness and accelerating voltage (Acc.V) have a strong affect on the quality of transmission EBSD patterns and orientation maps. Higher Acc.Vs are generally recommended to get good quality orientation maps. In case of very thin specimens, lowering the Acc.Vs will give better results. In the observation of a thin film of an 8Cr tempered martensite steel specimen, it is confirmed that t-EBSD can provide images and detailed quantitative orientation data comparable with that obtained by TEM. It is also shown that small precipitates of Cr23C6 with sizes around 30nm could be detected and their orientations measured. The Author(s), 2013 JOM Springer US; http://www.springer-ny.com 65/9(2013-09-01), 1254-1263 1047-4838 65:9<1254 2013 65 11837 https://doi.org/10.1007/s11837-013-0700-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11837-013-0700-6 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Suzuki Seiichi TSL Solutions KK, #SIC2-401, 5-4-30, Nishihashimoto, Midori-Ku, 252-0131, Kanagawa, Sagamihara, Japan aut NATIONALLICENCE 773 0- JOM Springer US; http://www.springer-ny.com 65/9(2013-09-01), 1254-1263 1047-4838 65:9<1254 2013 65 11837 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer