naa a22 4500 510770266 CHVBK 20180411083211.0 cr unu---uuuuu 180411e20130901xx s 000 0 eng 10.1007/s11837-013-0699-8 doi (NATIONALLICENCE)springer-10.1007/s11837-013-0699-8 Studies of Materials at the Nanometer Scale Using Coherent X-Ray Diffraction Imaging [Elektronische Daten] [Richard Sandberg, Zhifeng Huang, Rui Xu, Jose Rodriguez, Jianwei Miao] For many years, x-ray microscopy has been attractive for materials studies with its ability to image thick samples and provide nanometer-scale resolution. However, the ability to manufacture high-resolution x-ray optics has been a hurdle to achieving the full potential of diffraction limited x-ray imaging. Recently, the advent of bright and coherent x-ray sources at synchrotrons and x-ray free electron lasers has enabled a lensless imaging technique called coherent diffractive imaging (CDI). Since it was first demonstrated in 1999, CDI has been rapidly developing into a materials imaging technique with resolutions approaching a few nanometers. This review provides an overview of the development of CDI and several applications to nanometer-scale imaging in two and three dimensions of biological and condensed mater materials. Also, we review the development of tabletop, coherent, soft x-ray sources that provide a complimentary and potentially more accessible source for nanometer-scale coherent imaging of materials. TMS (outside the USA), 2013 Sandberg Richard Laboratory for Ultrafast Materials and Optical Sciences, Center for Integrated Nanotechnologies, Los Alamos National Laboratory, 87544, Los Alamos, NM, USA aut Huang Zhifeng Department of Physics and Astronomy, and California NanoSystems Institute, University of California, 90095, Los Angeles, CA, USA aut Xu Rui Department of Physics and Astronomy, and California NanoSystems Institute, University of California, 90095, Los Angeles, CA, USA aut Rodriguez Jose Department of Biological Chemistry, UCLA-DOE Institute for Genomics and Proteomics, University of California, 90095, Los Angeles, CA, USA aut Miao Jianwei Department of Physics and Astronomy, and California NanoSystems Institute, University of California, 90095, Los Angeles, CA, USA aut JOM Springer US; http://www.springer-ny.com 65/9(2013-09-01), 1208-1220 1047-4838 65:9<1208 2013 65 11837 https://doi.org/10.1007/s11837-013-0699-8 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11837-013-0699-8 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Sandberg Richard Laboratory for Ultrafast Materials and Optical Sciences, Center for Integrated Nanotechnologies, Los Alamos National Laboratory, 87544, Los Alamos, NM, USA aut NATIONALLICENCE 700 1- Huang Zhifeng Department of Physics and Astronomy, and California NanoSystems Institute, University of California, 90095, Los Angeles, CA, USA aut NATIONALLICENCE 700 1- Xu Rui Department of Physics and Astronomy, and California NanoSystems Institute, University of California, 90095, Los Angeles, CA, USA aut NATIONALLICENCE 700 1- Rodriguez Jose Department of Biological Chemistry, UCLA-DOE Institute for Genomics and Proteomics, University of California, 90095, Los Angeles, CA, USA aut NATIONALLICENCE 700 1- Miao Jianwei Department of Physics and Astronomy, and California NanoSystems Institute, University of California, 90095, Los Angeles, CA, USA aut NATIONALLICENCE 773 0- JOM Springer US; http://www.springer-ny.com 65/9(2013-09-01), 1208-1220 1047-4838 65:9<1208 2013 65 11837 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer