naa a22 4500 510771181 CHVBK 20180411083214.0 cr unu---uuuuu 180411e20131001xx s 000 0 eng 10.1007/s11837-013-0720-2 doi (NATIONALLICENCE)springer-10.1007/s11837-013-0720-2 Characterization of Solder Joint Reliability Using Cyclic Mechanical Fatigue Testing [Elektronische Daten] [Choong-Un Kim, Woong-Ho Bang, Huili Xu, Tae-Kyu Lee] This article summarizes the mechanics of two mechanical fatigue methods, cyclic bending fatigue and shear fatigue, in inducing failure in solder joints in package assemblies, and it presents the characteristics of fatigue failures resulting from these methods using example cases of Sn-Pb eutectic and Sn-rich Pb-free solder alloys. Numerical simulation suggests that both testing configurations induce fatigue failure by the crack-opening mode. In the case of bending fatigue, the strain induced by the bending displacement is found to be sensitive to chip geometry, and it induces fatigue cracks mainly at the solder matrix adjacent to the printed circuit board interface. In case of shear fatigue, the failure location is firmly fixed at the solder neck, created by solder mask, where an abrupt change in the solder geometry occurs. Both methods conclude that the Coffin-Manson model is the most appropriate model for the isothermal mechanical fatigue of solder alloys. An analysis of fatigue characteristics using the frame of the Coffin-Manson model produces several insightful results, such as the reason why Pb-free alloys show higher fatigue resistance than Sn-Pb alloys even if they are generally more brittle. Our analysis suggests that it is related to higher work hardening. All these results indicate that mechanical fatigue can be an extremely useful method for fast screening of defective package structures and also in gaining a better understanding of fatigue failure mechanism and prediction of reliability in solder joints. TMS, 2013 Kim Choong-Un Department of Materials Science and Engineering, The University of Texas at Arlington, 76019, Arlington, TX, USA aut Bang Woong-Ho Department of Materials Science and Engineering, The University of Texas at Arlington, 76019, Arlington, TX, USA aut Xu Huili Department of Materials Science and Engineering, The University of Texas at Arlington, 76019, Arlington, TX, USA aut Lee Tae-Kyu Interconnect Technology Team, Cisco System Inc., SJC-D-2, 95134, San Jose, CA, USA aut JOM Springer US; http://www.springer-ny.com 65/10(2013-10-01), 1362-1373 1047-4838 65:10<1362 2013 65 11837 https://doi.org/10.1007/s11837-013-0720-2 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11837-013-0720-2 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Kim Choong-Un Department of Materials Science and Engineering, The University of Texas at Arlington, 76019, Arlington, TX, USA aut NATIONALLICENCE 700 1- Bang Woong-Ho Department of Materials Science and Engineering, The University of Texas at Arlington, 76019, Arlington, TX, USA aut NATIONALLICENCE 700 1- Xu Huili Department of Materials Science and Engineering, The University of Texas at Arlington, 76019, Arlington, TX, USA aut NATIONALLICENCE 700 1- Lee Tae-Kyu Interconnect Technology Team, Cisco System Inc., SJC-D-2, 95134, San Jose, CA, USA aut NATIONALLICENCE 773 0- JOM Springer US; http://www.springer-ny.com 65/10(2013-10-01), 1362-1373 1047-4838 65:10<1362 2013 65 11837 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer