naa a22 4500 510800610 CHVBK 20180411083353.0 cr unu---uuuuu 180411e20130101xx s 000 0 eng 10.1007/s11664-012-2337-6 doi (NATIONALLICENCE)springer-10.1007/s11664-012-2337-6 Poisson Ratio of Epitaxial Germanium Films Grown on Silicon [Elektronische Daten] [Jayesh Bharathan, Jagdish Narayan, George Rozgonyi, Gary Bulman] An accurate knowledge of elastic constants of thin films is important in understanding the effect of strain on material properties. We have used residual thermal strain to measure the Poisson ratio of Ge films grown on Si ⟨001⟩ substrates, using the sin2 ψ method and high-resolution x-ray diffraction. The Poisson ratio of the Ge films was measured to be 0.25, compared with the bulk value of 0.27. Our study indicates that use of Poisson ratio instead of bulk compliance values yields a more accurate description of the state of in-plane strain present in the film. TMS, 2012 Germanium film nationallicence Poisson ratio nationallicence x-ray diffraction nationallicence Bharathan Jayesh Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Narayan Jagdish Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Rozgonyi George Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut Bulman Gary RTI International, 27709, Durham, NC, USA aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/1(2013-01-01), 40-46 0361-5235 42:1<40 2013 42 11664 https://doi.org/10.1007/s11664-012-2337-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-012-2337-6 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Bharathan Jayesh Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 700 1- Narayan Jagdish Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 700 1- Rozgonyi George Department of Materials Science and Engineering, North Carolina State University, 27695, Raleigh, NC, USA aut NATIONALLICENCE 700 1- Bulman Gary RTI International, 27709, Durham, NC, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/1(2013-01-01), 40-46 0361-5235 42:1<40 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer