naa a22 4500 510800645 CHVBK 20180411083353.0 cr unu---uuuuu 180411e20130101xx s 000 0 eng 10.1007/s11664-012-2332-y doi (NATIONALLICENCE)springer-10.1007/s11664-012-2332-y Gökçen M. Department of Physics, Faculty of Arts and Sciences, Düzce University, 81620, Düzce, Turkey aut Dielectric Properties of Au/PVA (Cobalt-Doped)/ n -Si Photoconductive Diodes [Elektronische Daten] [M. Gökçen] The voltage (V) and frequency (f) dependence of dielectric parameters such as the dielectric constant (ε′), dielectric loss (ε″), dielectric loss tangent (tanδ), real and imaginary parts of electrical modulus (M′ and M″), and alternating-current (AC) electrical conductivity (σ AC) of Au/PVA (cobalt-doped)/n-Si structures have been investigated by using experimental admittance measurements conducted at room temperature. The values of ε′, ε″, and tanδ were found to be strong functions of voltage and frequency, especially at low frequencies in the positive voltage region. It was observed that the values of ε′ and ε″ increase as the frequency decreases. The M′ values increase with increasing frequency due to increasing dielectric relaxation, while M″ values, in general, remain stable as frequency is changed. The σ AC values at each bias voltage increase with increasing frequency. TMS, 2012 Organic PVA layer nationallicence MPS structures nationallicence dielectric properties nationallicence electric modulus nationallicence AC electrical conductivity nationallicence Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/1(2013-01-01), 103-108 0361-5235 42:1<103 2013 42 11664 https://doi.org/10.1007/s11664-012-2332-y text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-012-2332-y text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Gökçen M. Department of Physics, Faculty of Arts and Sciences, Düzce University, 81620, Düzce, Turkey aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/1(2013-01-01), 103-108 0361-5235 42:1<103 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer