naa a22 4500 510801145 CHVBK 20180411092758.0 cr unu---uuuuu 180411e20130601xx s 000 0 eng 10.1007/s11664-013-2516-0 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2516-0 Transport Properties of Bulk Thermoelectrics: An International Round-Robin Study, Part II: Thermal Diffusivity, Specific Heat, and Thermal Conductivity [Elektronische Daten] [Hsin Wang, Wallace Porter, Harald Böttner, Jan König, Lidong Chen, Shengqiang Bai, Terry Tritt, Alex Mayolet, Jayantha Senawiratne, Charlene Smith, Fred Harris, Patricia Gilbert, Jeff Sharp, Jason Lo, Holger Kleinke, Laszlo Kiss] For bulk thermoelectrics, improvement of the figure of merit ZT to above 2 from the current values of 1.0 to 1.5 would enhance their competitiveness with alternative technologies. In recent years, the most significant improvements in ZT have mainly been due to successful reduction of thermal conductivity. However, thermal conductivity is difficult to measure directly at high temperatures. Combined measurements of thermal diffusivity, specific heat, and mass density are a widely used alternative to direct measurement of thermal conductivity. In this work, thermal conductivity is shown to be the factor in the calculation of ZT with the greatest measurement uncertainty. The International Energy Agency (IEA) group, under the implementing agreement for Advanced Materials for Transportation (AMT), has conducted two international round-robins since 2009. This paper, partII of our report on the international round-robin testing of transport properties of bulk bismuth telluride, focuses on thermal diffusivity, specific heat, and thermal conductivity measurements. TMS, 2013 Thermoelectric nationallicence thermal conductivity nationallicence thermal diffusivity nationallicence specific heat nationallicence power factor nationallicence figure of merit nationallicence Wang Hsin Oak Ridge National Laboratory, Oak Ridge, TN, USA aut Porter Wallace Oak Ridge National Laboratory, Oak Ridge, TN, USA aut Böttner Harald Fraunhofer Institute for Physical Measurement Techniques, Freiburg, Germany aut König Jan Fraunhofer Institute for Physical Measurement Techniques, Freiburg, Germany aut Chen Lidong Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, China aut Bai Shengqiang Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, China aut Tritt Terry Clemson University, Clemson, SC, USA aut Mayolet Alex Corning Inc., Corning, USA aut Senawiratne Jayantha Corning Inc., Corning, USA aut Smith Charlene Corning Inc., Corning, USA aut Harris Fred ZT-Plus Inc., Azusa, CA, USA aut Gilbert Patricia Marlow Industries, Dallas, TX, USA aut Sharp Jeff Marlow Industries, Dallas, TX, USA aut Lo Jason CANMET, Hamilton, ON, Canada aut Kleinke Holger University of Waterloo, Waterloo, ON, Canada aut Kiss Laszlo University of Quebec at Chicoutimi, Chicoutimi, QC, Canada aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/6(2013-06-01), 1073-1084 0361-5235 42:6<1073 2013 42 11664 https://doi.org/10.1007/s11664-013-2516-0 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2516-0 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Wang Hsin Oak Ridge National Laboratory, Oak Ridge, TN, USA aut NATIONALLICENCE 700 1- Porter Wallace Oak Ridge National Laboratory, Oak Ridge, TN, USA aut NATIONALLICENCE 700 1- Böttner Harald Fraunhofer Institute for Physical Measurement Techniques, Freiburg, Germany aut NATIONALLICENCE 700 1- König Jan Fraunhofer Institute for Physical Measurement Techniques, Freiburg, Germany aut NATIONALLICENCE 700 1- Chen Lidong Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, China aut NATIONALLICENCE 700 1- Bai Shengqiang Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, China aut NATIONALLICENCE 700 1- Tritt Terry Clemson University, Clemson, SC, USA aut NATIONALLICENCE 700 1- Mayolet Alex Corning Inc., Corning, USA aut NATIONALLICENCE 700 1- Senawiratne Jayantha Corning Inc., Corning, USA aut NATIONALLICENCE 700 1- Smith Charlene Corning Inc., Corning, USA aut NATIONALLICENCE 700 1- Harris Fred ZT-Plus Inc., Azusa, CA, USA aut NATIONALLICENCE 700 1- Gilbert Patricia Marlow Industries, Dallas, TX, USA aut NATIONALLICENCE 700 1- Sharp Jeff Marlow Industries, Dallas, TX, USA aut NATIONALLICENCE 700 1- Lo Jason CANMET, Hamilton, ON, Canada aut NATIONALLICENCE 700 1- Kleinke Holger University of Waterloo, Waterloo, ON, Canada aut NATIONALLICENCE 700 1- Kiss Laszlo University of Quebec at Chicoutimi, Chicoutimi, QC, Canada aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/6(2013-06-01), 1073-1084 0361-5235 42:6<1073 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence SWISSBIB 510801145 BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer