naa a22 4500 510801226 CHVBK 20180411083356.0 cr unu---uuuuu 180411e20130901xx s 000 0 eng 10.1007/s11664-013-2652-6 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2652-6 Effect of High-Humidity Testing on Material Parameters of Flexible Printed Circuit Board Materials [Elektronische Daten] [Sanna Lahokallio, Kirsi Saarinen, Laura Frisk] The tendency of polymers to absorb moisture impairs especially their electrical and mechanical properties. These are important characteristics for printed circuit board (PCB) materials, which should provide mechanical support as well as electrical insulation in many different environments in order to guarantee safe operation for electrical devices. Moreover, the effects of moisture are accelerated at increased temperatures. In this study, three flexible PCB dielectric materials, namely polyimide (PI), fluorinated ethylene-propylene (FEP), and polyethylene terephthalate (PET), were aged over different periods of time in a high-humidity test, in which the temperature was 85°C and relative humidity 85%. After aging, the changes in the structure of the polymers were studied by determining different material parameters such as modulus of elasticity, glass-transition temperature, melting point, coefficient of thermal expansion, water absorption, and crystallinity, and changes in the chemical structure with several techniques including thermomechanical analysis, differential scanning calorimetry, Fourier-transform infrared spectroscopy, moisture analysis, and a precision scale. The results showed that PI was extremely stable under the aging conditions and therefore an excellent choice for electrical applications under harsh conditions. Similarly, FEP proved to be relatively stable under the applied aging conditions. However, its crystallinity increased markedly during aging, and after 6000h of aging the results indicated oxidation. PET suffered from hydrolysis during the test, leading to its embrittlement after 2000h of aging. TMS, 2013 Aging nationallicence high humidity nationallicence flexible PCB dielectric film nationallicence oxidation nationallicence crystallinity nationallicence Lahokallio Sanna Department of Electrical Engineering, Tampere University of Technology, P.O. Box 692, 33101, Tampere, Finland aut Saarinen Kirsi Department of Electrical Engineering, Tampere University of Technology, P.O. Box 692, 33101, Tampere, Finland aut Frisk Laura Department of Electrical Engineering, Tampere University of Technology, P.O. Box 692, 33101, Tampere, Finland aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/9(2013-09-01), 2822-2834 0361-5235 42:9<2822 2013 42 11664 https://doi.org/10.1007/s11664-013-2652-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2652-6 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Lahokallio Sanna Department of Electrical Engineering, Tampere University of Technology, P.O. Box 692, 33101, Tampere, Finland aut NATIONALLICENCE 700 1- Saarinen Kirsi Department of Electrical Engineering, Tampere University of Technology, P.O. Box 692, 33101, Tampere, Finland aut NATIONALLICENCE 700 1- Frisk Laura Department of Electrical Engineering, Tampere University of Technology, P.O. Box 692, 33101, Tampere, Finland aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/9(2013-09-01), 2822-2834 0361-5235 42:9<2822 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer