naa a22 4500 510801358 CHVBK 20180411083356.0 cr unu---uuuuu 180411e20130701xx s 000 0 eng 10.1007/s11664-012-2254-8 doi (NATIONALLICENCE)springer-10.1007/s11664-012-2254-8 Thermal Fatigue of Cast and Hot-Pressed Lead-Antimony-Silver-Tellurium (LAST) Thermoelectric Materials [Elektronische Daten] [Jennifer Ni, Eldon Case] Lead-antimony-silver-tellurium (LAST) thermoelectric materials are candidates for waste-heat recovery applications. However, rapid heating and cooling (thermal shock) imposes thermomechanical stresses that can cause microcracking. Waste-heat recovery applications involve thermal fatigue, in which a series of hundreds or thousands of individual thermal shock events can lead to accumulation of microcrack damage in brittle thermoelectrics such as LAST. Microcracking in turn leads to a decrease in transport properties, such as electrical conductivity and thermal conductivity, and mechanical properties, including elastic modulus and strength. Thus, microcracking can affect both thermoelectric performance and mechanical integrity. In this study, LAST specimens were rapidly cooled (quenched) into a fluid (water or silicone oil) in order to compare the results with the vast majority of thermal shock studies of brittle materials that are quenched in a similar manner. Decreases in elastic modulus, E, with accumulating microcrack damage were measured using resonant ultrasound spectroscopy (RUS). The evolution of thermal fatigue damage observed in this study is also described well by an equation that successfully describes thermal fatigue damage in a variety of brittle materials. TMS, 2012 Thermoelectrics nationallicence thermal fatigue nationallicence Young's modulus nationallicence waste-heat recovery nationallicence Ni Jennifer Chemical Engineering and Materials Science Department, Michigan State University, 48824, East Lansing, MI, USA aut Case Eldon Chemical Engineering and Materials Science Department, Michigan State University, 48824, East Lansing, MI, USA aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 1382-1388 0361-5235 42:7<1382 2013 42 11664 https://doi.org/10.1007/s11664-012-2254-8 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-012-2254-8 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Ni Jennifer Chemical Engineering and Materials Science Department, Michigan State University, 48824, East Lansing, MI, USA aut NATIONALLICENCE 700 1- Case Eldon Chemical Engineering and Materials Science Department, Michigan State University, 48824, East Lansing, MI, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 1382-1388 0361-5235 42:7<1382 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer