naa a22 4500 510801579 CHVBK 20180411083357.0 cr unu---uuuuu 180411e20130701xx s 000 0 eng 10.1007/s11664-013-2564-5 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2564-5 Numerical Analysis of the Boundary Scattering Effect on Transport Properties in Bi-Sb Nanowires [Elektronische Daten] [Yuta Nabatame, Tsuyoshi Matsumoto, Yuki Ichige, Takashi Komine, Ryuji Sugita, Masayuki Murata, Yasuhiro Hasegawa] In this study, we have numerically analyzed the transport properties of Bi-Sb nanowires, taking into account wire boundary scattering. Wire boundary scattering slightly decreased the Seebeck coefficient of Bi-Sb nanowires. This effect is due to the observation that boundary scattering and the mobility ratio of L-point electrons to T-point holes in the nanowires are smaller than those in bulk Bi-Sb because the wire boundary scattering suppresses the mobilities of L-point electrons and heavy holes. The largest Seebeck coefficient for all wire diameters was obtained when the Sb concentration was 5at.%. The effective mass approached zero near 5at.% Sb, and the small effective mass led to a large subband shift in each band. Thus, a small effective mass enhances the quantum effect at a fixed wire diameter, even if wire boundary scattering is taken into account. TMS, 2013 Transport properties nationallicence Bi-Sb nationallicence nanowire nationallicence wire boundary scattering nationallicence Nabatame Yuta Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa-cho, 316-8511, Hitachi, Ibaraki, Japan aut Matsumoto Tsuyoshi Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa-cho, 316-8511, Hitachi, Ibaraki, Japan aut Ichige Yuki Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa-cho, 316-8511, Hitachi, Ibaraki, Japan aut Komine Takashi Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa-cho, 316-8511, Hitachi, Ibaraki, Japan aut Sugita Ryuji Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa-cho, 316-8511, Hitachi, Ibaraki, Japan aut Murata Masayuki Faculty of Engineering, Saitama University, 255 Shimo-okubo, 338-8570, Sakura-ku, Saitama, Japan aut Hasegawa Yasuhiro Faculty of Engineering, Saitama University, 255 Shimo-okubo, 338-8570, Sakura-ku, Saitama, Japan aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2172-2177 0361-5235 42:7<2172 2013 42 11664 https://doi.org/10.1007/s11664-013-2564-5 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2564-5 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Nabatame Yuta Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa-cho, 316-8511, Hitachi, Ibaraki, Japan aut NATIONALLICENCE 700 1- Matsumoto Tsuyoshi Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa-cho, 316-8511, Hitachi, Ibaraki, Japan aut NATIONALLICENCE 700 1- Ichige Yuki Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa-cho, 316-8511, Hitachi, Ibaraki, Japan aut NATIONALLICENCE 700 1- Komine Takashi Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa-cho, 316-8511, Hitachi, Ibaraki, Japan aut NATIONALLICENCE 700 1- Sugita Ryuji Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa-cho, 316-8511, Hitachi, Ibaraki, Japan aut NATIONALLICENCE 700 1- Murata Masayuki Faculty of Engineering, Saitama University, 255 Shimo-okubo, 338-8570, Sakura-ku, Saitama, Japan aut NATIONALLICENCE 700 1- Hasegawa Yasuhiro Faculty of Engineering, Saitama University, 255 Shimo-okubo, 338-8570, Sakura-ku, Saitama, Japan aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2172-2177 0361-5235 42:7<2172 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer