naa a22 4500 510801714 CHVBK 20180411083358.0 cr unu---uuuuu 180411e20130701xx s 000 0 eng 10.1007/s11664-013-2563-6 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2563-6 Spatially Resolved Thermal Conductivity Measurements Using a Thermoreflectance Microprobe [Elektronische Daten] [A. Neubrand, J. Dadda, E. Mueller, S. Perlt, T. Höche] A transient thermoreflectance technique capable of creating maps of the out-of-plane thermal conductivity of materials with spatial resolution of 5μm is presented. The applied noncontact optical microprobe uses a thin reflective metal film as temperature transducer and heat reservoir. The parameters of the experimental setup guarantee that the heat flow is one dimensional. Thus, relatively simple mathematical relations can be used to extract the thermal conductivity from the recorded signal shape, which is important for thermal conductivity maps with high pixel count. For reference materials (soda-lime glass and PbTe), the determined thermal conductivities were in good agreement with bulk values, indicating a typical measurement uncertainty of 10%. For low-conductivity substrates, the measuring scheme is relatively insensitive to thermal interface resistance. Thermal conductivity maps of lead-antimony-silver-tellurium surfaces showed distinct features which could be correlated with optical surface micrographs. The local conductivity fluctuations can possibly be attributed to local changes in chemical composition and secondary phase formation. TMS, 2013 Thermal conductivity nationallicence thermoreflectance nationallicence LAST nationallicence microanalysis nationallicence Neubrand A. Fraunhofer Institute for Mechanics of Materials IWM, Wöhlerstraße 11, 79108, Freiburg, Germany aut Dadda J. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Cologne, Germany aut Mueller E. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Cologne, Germany aut Perlt S. Leibniz Institute of Surface Modification, Permoserstraße 15, 04318, Leipzig, Germany aut Höche T. Fraunhofer Institute for Mechanics of Materials IWM, Walter-Hülse-Str. 1, 06120, Halle, Germany aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2165-2171 0361-5235 42:7<2165 2013 42 11664 https://doi.org/10.1007/s11664-013-2563-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2563-6 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Neubrand A. Fraunhofer Institute for Mechanics of Materials IWM, Wöhlerstraße 11, 79108, Freiburg, Germany aut NATIONALLICENCE 700 1- Dadda J. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Cologne, Germany aut NATIONALLICENCE 700 1- Mueller E. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Cologne, Germany aut NATIONALLICENCE 700 1- Perlt S. Leibniz Institute of Surface Modification, Permoserstraße 15, 04318, Leipzig, Germany aut NATIONALLICENCE 700 1- Höche T. Fraunhofer Institute for Mechanics of Materials IWM, Walter-Hülse-Str. 1, 06120, Halle, Germany aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2165-2171 0361-5235 42:7<2165 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer