naa a22 4500 51080229X CHVBK 20180411083400.0 cr unu---uuuuu 180411e20130701xx s 000 0 eng 10.1007/s11664-012-2361-6 doi (NATIONALLICENCE)springer-10.1007/s11664-012-2361-6 Characterization of Nonstoichiometric Ti1+ x Se2 Prepared by the Method of Modulated Elemental Reactants [Elektronische Daten] [Daniel Moore, Luke Sitts, Matthew Stolt, Matt Beekman, David Johnson] The method of modulated elemental reactants (MER) is used to prepare the layered compound Ti1+x Se2. Using a thin-film precursor prepared by sequentially depositing elemental titanium and selenium by physical vapor deposition, the binary compound is readily formed by short-duration annealing at 350°C. x-Ray diffraction indicates that TiSe2 layers in the film are highly oriented with the c-axis of the layers perpendicular to the substrate. Temperature-dependent electrical resistivity and Hall coefficient measurements for the MER-prepared specimen reveal temperature dependence that is distinct from crystalline stoichiometric TiSe2 in bulk form. The room-temperature Seebeck coefficient was measured to be −134μV/K, which is opposite in sign and significantly larger in magnitude than stoichiometric crystalline TiSe2, suggesting that carrier transport in the disordered film is markedly different from the bulk crystalline material. TMS, 2012 TiSe2 nationallicence thermoelectric nationallicence turbostratic disorder nationallicence Moore Daniel Department of Chemistry, University of Oregon, Eugene, OR, USA aut Sitts Luke Department of Chemistry, University of Oregon, Eugene, OR, USA aut Stolt Matthew Department of Chemistry, University of Oregon, Eugene, OR, USA aut Beekman Matt Department of Chemistry, University of Oregon, Eugene, OR, USA aut Johnson David Department of Chemistry, University of Oregon, Eugene, OR, USA aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 1647-1651 0361-5235 42:7<1647 2013 42 11664 https://doi.org/10.1007/s11664-012-2361-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-012-2361-6 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Moore Daniel Department of Chemistry, University of Oregon, Eugene, OR, USA aut NATIONALLICENCE 700 1- Sitts Luke Department of Chemistry, University of Oregon, Eugene, OR, USA aut NATIONALLICENCE 700 1- Stolt Matthew Department of Chemistry, University of Oregon, Eugene, OR, USA aut NATIONALLICENCE 700 1- Beekman Matt Department of Chemistry, University of Oregon, Eugene, OR, USA aut NATIONALLICENCE 700 1- Johnson David Department of Chemistry, University of Oregon, Eugene, OR, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 1647-1651 0361-5235 42:7<1647 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer