naa a22 4500 510802443 CHVBK 20180411083401.0 cr unu---uuuuu 180411e20130701xx s 000 0 eng 10.1007/s11664-013-2530-2 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2530-2 A Novel zT Meter Based on the Porcupine Method and a Survey on the Size of the Snout Correction Needed for Various Thermoelectric Devices [Elektronische Daten] [Andrea De Marchi, Valter Giaretto, Simone Caron, Andrea Tona] Measurements of the dimensionless figure of merit of different thermoelectric devices are presented and discussed, as obtained with a prototype zT meter which is based on the porcupine method. The instrument's architecture and operation are discussed to support claims made on the accuracy of results. Different types of thermoelectric devices were tested, focusing on the size of the porcupine's snout for each. The latter is probably the major source of uncertainty in Harman methods, but is well measurable with the porcupine method, which therefore allows definition of the correction needed to obtain accurate evaluation of zT. Accuracies much better than 1% in the determination of the dimensionless figure of merit and series resistance are possible in this way. A survey of various devices is reported, and results are shown to indicate that corrections up to the 10% level and more are needed, depending on the configuration. TMS, 2013 Thermoelectricity nationallicence figure of merit nationallicence vector impedance meter nationallicence zT meter nationallicence porcupine diagram nationallicence De Marchi Andrea Dipartimento di Elettronica e Telecomunicazioni, Politecnico di Torino, C.so Duca degli Abruzzi, 24, 10129, Turin, Italy aut Giaretto Valter Dipartimento Energia, Politecnico di Torino, C.so Duca degli Abruzzi, 24, 10129, Turin, Italy aut Caron Simone Dipartimento di Elettronica e Telecomunicazioni, Politecnico di Torino, C.so Duca degli Abruzzi, 24, 10129, Turin, Italy aut Tona Andrea Dipartimento di Ingegneria Gestionale e della Produzione, Politecnico di Torino, C.so Duca degli Abruzzi, 24, 10129, Turin, Italy aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2067-2072 0361-5235 42:7<2067 2013 42 11664 https://doi.org/10.1007/s11664-013-2530-2 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2530-2 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- De Marchi Andrea Dipartimento di Elettronica e Telecomunicazioni, Politecnico di Torino, C.so Duca degli Abruzzi, 24, 10129, Turin, Italy aut NATIONALLICENCE 700 1- Giaretto Valter Dipartimento Energia, Politecnico di Torino, C.so Duca degli Abruzzi, 24, 10129, Turin, Italy aut NATIONALLICENCE 700 1- Caron Simone Dipartimento di Elettronica e Telecomunicazioni, Politecnico di Torino, C.so Duca degli Abruzzi, 24, 10129, Turin, Italy aut NATIONALLICENCE 700 1- Tona Andrea Dipartimento di Ingegneria Gestionale e della Produzione, Politecnico di Torino, C.so Duca degli Abruzzi, 24, 10129, Turin, Italy aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2067-2072 0361-5235 42:7<2067 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer