naa a22 4500 510802532 CHVBK 20180411083401.0 cr unu---uuuuu 180411e20130701xx s 000 0 eng 10.1007/s11664-012-2404-z doi (NATIONALLICENCE)springer-10.1007/s11664-012-2404-z High-Temperature Measurement of Seebeck Coefficient and Electrical Conductivity [Elektronische Daten] [J. de Boor, C. Stiewe, P. Ziolkowski, T. Dasgupta, G. Karpinski, E. Lenz, F. Edler, E. Mueller] We have developed a system for simultaneous measurement of the electrical conductivity and Seebeck coefficient for thermoelectric samples in the temperature region of 300K to 1000K. The system features flexibility in sample dimensions and easy sample exchange. To verify the accuracy of the setup we have referenced our system against the NIST standard reference material 3451 and other setups and can show good agreement. The developed system has been used in the search for a possible high-temperature Seebeck standard material. FeSi2 emerges as a possible candidate, as this material combines properties typical of thermoelectric materials with large-scale fabrication, good spatial homogeneity, and thermal stability up to 1000K. TMS, 2013 Thermoelectrics nationallicence measurement technique nationallicence measurement of Seebeck coefficient nationallicence Seebeck coefficient reference material nationallicence de Boor J. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut Stiewe C. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut Ziolkowski P. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut Dasgupta T. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut Karpinski G. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut Lenz E. Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, 10587, Berlin, Germany aut Edler F. Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, 10587, Berlin, Germany aut Mueller E. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 1711-1718 0361-5235 42:7<1711 2013 42 11664 https://doi.org/10.1007/s11664-012-2404-z text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-012-2404-z text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- de Boor J. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut NATIONALLICENCE 700 1- Stiewe C. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut NATIONALLICENCE 700 1- Ziolkowski P. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut NATIONALLICENCE 700 1- Dasgupta T. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut NATIONALLICENCE 700 1- Karpinski G. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut NATIONALLICENCE 700 1- Lenz E. Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, 10587, Berlin, Germany aut NATIONALLICENCE 700 1- Edler F. Physikalisch-Technische Bundesanstalt, Abbestraße 2-12, 10587, Berlin, Germany aut NATIONALLICENCE 700 1- Mueller E. German Aerospace Center, Institute of Materials Research, Linder Höhe, 51147, Köln, Germany aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 1711-1718 0361-5235 42:7<1711 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer