naa a22 4500 510802710 CHVBK 20180411083402.0 cr unu---uuuuu 180411e20130701xx s 000 0 eng 10.1007/s11664-013-2505-3 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2505-3 Thermal Conductivity Measurement Methods for SiGe Thermoelectric Materials [Elektronische Daten] [L. Llin, A. Samarelli, Y. Zhang, J. Weaver, P. Dobson, S. Cecchi, D. Chrastina, G. Isella, T. Etzelstorfer, J. Stangl, E. Gubler, D. Paul] A new technique to measure the thermal conductivity of thermoelectric materials at the microscale has been developed. The structure allows the electrical conductivity, thermal conductivity, and Seebeck coefficient to be measured on a single device. The thermal conductivity is particularly difficult to measure since it requires precise estimation of the heat flux injected into the material. The new technique is based on a differential method where the parasitic contributions of the supporting beams of a Hall bar are removed. The thermal measurements with integrated platinum thermometers on the device are cross-checked using thermal atomic force microscopy and validated by finite-element analysis simulations. TMS, 2013 Silicon germanium nationallicence thermal conductivity nationallicence thermoelectrics nationallicence heterostructure nationallicence device fabrication nationallicence Llin L. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut Samarelli A. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut Zhang Y. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut Weaver J. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut Dobson P. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut Cecchi S. L-NESS, Politecnico di Milano, Como, Italy aut Chrastina D. L-NESS, Politecnico di Milano, Como, Italy aut Isella G. L-NESS, Politecnico di Milano, Como, Italy aut Etzelstorfer T. Johannes Kepler Universitt, Linz, Austria aut Stangl J. Johannes Kepler Universitt, Linz, Austria aut Gubler E. ETH Zurich, Zurich, Switzerland aut Paul D. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2376-2380 0361-5235 42:7<2376 2013 42 11664 https://doi.org/10.1007/s11664-013-2505-3 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2505-3 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Llin L. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut NATIONALLICENCE 700 1- Samarelli A. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut NATIONALLICENCE 700 1- Zhang Y. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut NATIONALLICENCE 700 1- Weaver J. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut NATIONALLICENCE 700 1- Dobson P. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut NATIONALLICENCE 700 1- Cecchi S. L-NESS, Politecnico di Milano, Como, Italy aut NATIONALLICENCE 700 1- Chrastina D. L-NESS, Politecnico di Milano, Como, Italy aut NATIONALLICENCE 700 1- Isella G. L-NESS, Politecnico di Milano, Como, Italy aut NATIONALLICENCE 700 1- Etzelstorfer T. Johannes Kepler Universitt, Linz, Austria aut NATIONALLICENCE 700 1- Stangl J. Johannes Kepler Universitt, Linz, Austria aut NATIONALLICENCE 700 1- Gubler E. ETH Zurich, Zurich, Switzerland aut NATIONALLICENCE 700 1- Paul D. School of Engineering, University of Glasgow, Rankine Building, Oakfield Avenue, G12 8LT, Glasgow, UK aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2376-2380 0361-5235 42:7<2376 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer