naa a22 4500 510802788 CHVBK 20180411083403.0 cr unu---uuuuu 180411e20130701xx s 000 0 eng 10.1007/s11664-013-2520-4 doi (NATIONALLICENCE)springer-10.1007/s11664-013-2520-4 Thermal Conductivity of an Individual Bismuth Nanowire Covered with a Quartz Template Using a 3-Omega Technique [Elektronische Daten] [Yasuhiro Hasegawa, Masayuki Murata, Fumiaki Tsunemi, Yusuke Saito, Katsuhito Shirota, Takashi Komine, Chris Dames, Javier Garay] Thermal conductivity is estimated using a 3-omega technique for an individual bismuth nanowire (diameter: 595nm, length: 2.24mm) covered with a quartz template. To evaluate the thermal conductivity of the nanowire, we propose a simple model of thermal and electrical transfer functions for the nanowire that assumes a linear combination of that of the line heater on the substrate and a suspended wire. Since the out-of-phase third-harmonic component of the electrical transfer function depends only on the thermal diffusivity of the nanowire, measurement of the frequency dependence is carried out. A distinct extreme value of the frequency has been observed, as expected, and estimation of the thermal conductivity of the nanowire covered with the quartz is attempted. Although the thermal conductivity at 300K is 9.8W/mK, somewhat smaller than that of bulk bismuth, the temperature dependence of the thermal conductivity is quite different from that of bulk bismuth, and decreased linearly with decreasing temperature. In particular, this shows that the thermal conductivity obtained is suppressed in the low-temperature region by phonon confinement in the nanowire. TMS, 2013 Individual bismuth nanowire nationallicence thermal conductivity nationallicence 3-omega technique nationallicence Hasegawa Yasuhiro Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, 338-8570, Saitama, Japan aut Murata Masayuki Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, 338-8570, Saitama, Japan aut Tsunemi Fumiaki Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, 338-8570, Saitama, Japan aut Saito Yusuke Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, 338-8570, Saitama, Japan aut Shirota Katsuhito Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, 338-8570, Saitama, Japan aut Komine Takashi Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa, 316-8511, Hitachi, Ibaraki, Japan aut Dames Chris Department of Mechanical Engineering, University of California, 94720, Berkeley, CA, USA aut Garay Javier Department of Mechanical Engineering, University of California, 92521, Riverside, CA, USA aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2048-2055 0361-5235 42:7<2048 2013 42 11664 https://doi.org/10.1007/s11664-013-2520-4 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2520-4 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Hasegawa Yasuhiro Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, 338-8570, Saitama, Japan aut NATIONALLICENCE 700 1- Murata Masayuki Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, 338-8570, Saitama, Japan aut NATIONALLICENCE 700 1- Tsunemi Fumiaki Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, 338-8570, Saitama, Japan aut NATIONALLICENCE 700 1- Saito Yusuke Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, 338-8570, Saitama, Japan aut NATIONALLICENCE 700 1- Shirota Katsuhito Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, 338-8570, Saitama, Japan aut NATIONALLICENCE 700 1- Komine Takashi Faculty of Engineering, Ibaraki University, 4-12-1 Nakanarusawa, 316-8511, Hitachi, Ibaraki, Japan aut NATIONALLICENCE 700 1- Dames Chris Department of Mechanical Engineering, University of California, 94720, Berkeley, CA, USA aut NATIONALLICENCE 700 1- Garay Javier Department of Mechanical Engineering, University of California, 92521, Riverside, CA, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2048-2055 0361-5235 42:7<2048 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer