naa a22 4500 510803067 CHVBK 20180411083404.0 cr unu---uuuuu 180411e20130701xx s 000 0 eng 10.1007/s11664-013-2579-y doi (NATIONALLICENCE)springer-10.1007/s11664-013-2579-y Simulations for the Development of Thermoelectric Measurements [Elektronische Daten] [Knud Zabrocki, Pawel Ziolkowski, Titas Dasgupta, Johannes de Boor, Eckhard Müller] In thermoelectricity, continuum theoretical equations are usually used for the calculation of the characteristics and performance of thermoelectric elements, modules or devices as a function of external parameters (material, geometry, temperatures, current, flow, load, etc.). An increasing number of commercial software packages aimed at applications, such as COMSOL and ANSYS, contain vkernels using direct thermoelectric coupling. Application of these numerical tools also allows analysis of physical measurement conditions and can lead to specifically adapted methods for developing special test equipment required for the determination of TE material and module properties. System-theoretical and simulation-based considerations of favorable geometries are taken into account to create draft sketches in the development of such measurement systems. Particular consideration is given to the development of transient measurement methods, which have great advantages compared with the conventional static methods in terms of the measurement duration required. In this paper the benefits of using numerical tools in designing measurement facilities are shown using two examples. The first is the determination of geometric correction factors in four-point probe measurement of electrical conductivity, whereas the second example is focused on the so-called combined thermoelectric measurement (CTEM) system, where all thermoelectric material properties (Seebeck coefficient, electrical and thermal conductivity, and Harman measurement of zT) are measured in a combined way. Here, we want to highlight especially the measurement of thermal conductivity in a transient mode. Factors influencing the measurement results such as coupling to the environment due to radiation, heat losses via the mounting of the probe head, as well as contact resistance between the sample and sample holder are illustrated, analyzed, and discussed. By employing the results of the simulations, we have developed an improved sample head that allows for measurements over a larger temperature interval with enhanced accuracy. TMS, 2013 Measurement of thermoelectric properties nationallicence electrical resistivity/conductivity measurement nationallicence error correction nationallicence finite-element modeling nationallicence ANSYS nationallicence Zabrocki Knud German Aerospace Center (DLR), Institute of Materials Research, Thermoelectric Materials and Systems, Linder Höhe, 51147, Cologne, Germany aut Ziolkowski Pawel German Aerospace Center (DLR), Institute of Materials Research, Thermoelectric Materials and Systems, Linder Höhe, 51147, Cologne, Germany aut Dasgupta Titas German Aerospace Center (DLR), Institute of Materials Research, Thermoelectric Materials and Systems, Linder Höhe, 51147, Cologne, Germany aut de Boor Johannes German Aerospace Center (DLR), Institute of Materials Research, Thermoelectric Materials and Systems, Linder Höhe, 51147, Cologne, Germany aut Müller Eckhard German Aerospace Center (DLR), Institute of Materials Research, Thermoelectric Materials and Systems, Linder Höhe, 51147, Cologne, Germany aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2402-2408 0361-5235 42:7<2402 2013 42 11664 https://doi.org/10.1007/s11664-013-2579-y text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-013-2579-y text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Zabrocki Knud German Aerospace Center (DLR), Institute of Materials Research, Thermoelectric Materials and Systems, Linder Höhe, 51147, Cologne, Germany aut NATIONALLICENCE 700 1- Ziolkowski Pawel German Aerospace Center (DLR), Institute of Materials Research, Thermoelectric Materials and Systems, Linder Höhe, 51147, Cologne, Germany aut NATIONALLICENCE 700 1- Dasgupta Titas German Aerospace Center (DLR), Institute of Materials Research, Thermoelectric Materials and Systems, Linder Höhe, 51147, Cologne, Germany aut NATIONALLICENCE 700 1- de Boor Johannes German Aerospace Center (DLR), Institute of Materials Research, Thermoelectric Materials and Systems, Linder Höhe, 51147, Cologne, Germany aut NATIONALLICENCE 700 1- Müller Eckhard German Aerospace Center (DLR), Institute of Materials Research, Thermoelectric Materials and Systems, Linder Höhe, 51147, Cologne, Germany aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/7(2013-07-01), 2402-2408 0361-5235 42:7<2402 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer