<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>     naa a22        4500</leader>
  <controlfield tag="001">510803377</controlfield>
  <controlfield tag="003">CHVBK</controlfield>
  <controlfield tag="005">20180411083405.0</controlfield>
  <controlfield tag="007">cr unu---uuuuu</controlfield>
  <controlfield tag="008">180411e20131201xx      s     000 0 eng  </controlfield>
  <datafield tag="024" ind1="7" ind2="0">
   <subfield code="a">10.1007/s11664-013-2720-y</subfield>
   <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/s11664-013-2720-y</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
   <subfield code="a">Effect of Poly(4-vinylphenol) Concentration Increase on Deposition Rate of Dielectric Thin Film Fabrication by Using Electrohydrodynamic Atomization</subfield>
   <subfield code="h">[Elektronische Daten]</subfield>
   <subfield code="c">[Adnan Ali, Yun Lee, Kyung Choi, Jeongdai Jo]</subfield>
  </datafield>
  <datafield tag="520" ind1="3" ind2=" ">
   <subfield code="a">In this work, the effect of poly(4-vinylphenol) (PVP) concentration increase on electrohydrodynamic atomization and its deposition rate has been studied. The aim of this study is to further increase the deposition rate of uniform dielectric thin films by the nonvacuum electrohydrodynamic atomization process. The operating envelope has been explored by subjecting ink to controlled flow through a metallic capillary exposed to an electric field at ambient temperature. It has been observed that greater applied voltage is required to develop a stable cone jet from a highly concentrated PVP meniscus, in comparison with lower concentration. A combination of optimized parameters has been used from the developed operating envelope to generate an electrohydrodynamic jet, which subsequently disintegrated into droplets, thus depositing a uniform PVP thin film on indium tin oxide-coated polyethylene terephthalate substrates with average thickness of ~40nm at constant substrate speed of 3mm/s. The PVP thin film has been characterized by using scanning electron microscopy, x-ray photoelectron spectroscopy, and ultraviolet (UV)-visible spectroscopy.</subfield>
  </datafield>
  <datafield tag="540" ind1=" " ind2=" ">
   <subfield code="a">TMS, 2013</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">Electrohydrodynamic atomization</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">dielectric thin film</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">PVP</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">ITO-coated PET</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">transmittance</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Ali</subfield>
   <subfield code="D">Adnan</subfield>
   <subfield code="u">Department of Mechatronics Engineering, Jeju National University, Jeju, South Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Lee</subfield>
   <subfield code="D">Yun</subfield>
   <subfield code="u">Department of Mechatronics Engineering, Jeju National University, Jeju, South Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Choi</subfield>
   <subfield code="D">Kyung</subfield>
   <subfield code="u">Department of Mechatronics Engineering, Jeju National University, Jeju, South Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Jo</subfield>
   <subfield code="D">Jeongdai</subfield>
   <subfield code="u">Korean Institute of Machinery and Materials, Yuseong-Gu, 305-343, Daejeon, South Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
   <subfield code="t">Journal of Electronic Materials</subfield>
   <subfield code="d">Springer US; http://www.springer-ny.com</subfield>
   <subfield code="g">42/12(2013-12-01), 3512-3518</subfield>
   <subfield code="x">0361-5235</subfield>
   <subfield code="q">42:12&lt;3512</subfield>
   <subfield code="1">2013</subfield>
   <subfield code="2">42</subfield>
   <subfield code="o">11664</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="u">https://doi.org/10.1007/s11664-013-2720-y</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="908" ind1=" " ind2=" ">
   <subfield code="D">1</subfield>
   <subfield code="a">research-article</subfield>
   <subfield code="2">jats</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/s11664-013-2720-y</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Ali</subfield>
   <subfield code="D">Adnan</subfield>
   <subfield code="u">Department of Mechatronics Engineering, Jeju National University, Jeju, South Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Lee</subfield>
   <subfield code="D">Yun</subfield>
   <subfield code="u">Department of Mechatronics Engineering, Jeju National University, Jeju, South Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Choi</subfield>
   <subfield code="D">Kyung</subfield>
   <subfield code="u">Department of Mechatronics Engineering, Jeju National University, Jeju, South Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Jo</subfield>
   <subfield code="D">Jeongdai</subfield>
   <subfield code="u">Korean Institute of Machinery and Materials, Yuseong-Gu, 305-343, Daejeon, South Korea</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">773</subfield>
   <subfield code="E">0-</subfield>
   <subfield code="t">Journal of Electronic Materials</subfield>
   <subfield code="d">Springer US; http://www.springer-ny.com</subfield>
   <subfield code="g">42/12(2013-12-01), 3512-3518</subfield>
   <subfield code="x">0361-5235</subfield>
   <subfield code="q">42:12&lt;3512</subfield>
   <subfield code="1">2013</subfield>
   <subfield code="2">42</subfield>
   <subfield code="o">11664</subfield>
  </datafield>
  <datafield tag="900" ind1=" " ind2="7">
   <subfield code="a">Metadata rights reserved</subfield>
   <subfield code="b">Springer special CC-BY-NC licence</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="898" ind1=" " ind2=" ">
   <subfield code="a">BK010053</subfield>
   <subfield code="b">XK010053</subfield>
   <subfield code="c">XK010000</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
 </record>
</collection>
