naa a22 4500 510803504 CHVBK 20180411083406.0 cr unu---uuuuu 180411e20130301xx s 000 0 eng 10.1007/s11664-012-2381-2 doi (NATIONALLICENCE)springer-10.1007/s11664-012-2381-2 Effect of Annealing Twins on Electromigration in Ag-8Au-3Pd Bonding Wires [Elektronische Daten] [Tung-Han Chuang, Hsi-Ching Wang, Chien-Hsun Chuang, Jun-Der Lee, Hsing-Hua Tsai] An innovative Ag-8Au-3Pd bonding wire with a high twin density has been produced. The grain size of this annealing-twinned wire changes moderately during electrical stressing, unlike that of the conventional grained wire, which increases drastically and even leads to a bamboo structure. In addition, the durability against electromigration of the annealing-twinned Ag-8Au-3Pd alloy wire is higher than that of the conventional grained wire. This higher durability can be ascribed to the surface reconstruction of a stepwise morphology and slow grain growth resulting from the abundance of annealing twins in this wire. TMS, 2012 Electromigration nationallicence Ag-8Au-3Pd alloy wire nationallicence annealing twins nationallicence surface reconstruction nationallicence Chuang Tung-Han Institute of Materials Science and Engineering, National Taiwan University, 106, Taipei, Taiwan aut Wang Hsi-Ching Institute of Materials Science and Engineering, National Taiwan University, 106, Taipei, Taiwan aut Chuang Chien-Hsun Institute of Materials Science and Engineering, National Taiwan University, 106, Taipei, Taiwan aut Lee Jun-Der Wire Technology Co., LTD, 432, Taichung, Taiwan aut Tsai Hsing-Hua Wire Technology Co., LTD, 432, Taichung, Taiwan aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/3(2013-03-01), 545-551 0361-5235 42:3<545 2013 42 11664 https://doi.org/10.1007/s11664-012-2381-2 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-012-2381-2 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Chuang Tung-Han Institute of Materials Science and Engineering, National Taiwan University, 106, Taipei, Taiwan aut NATIONALLICENCE 700 1- Wang Hsi-Ching Institute of Materials Science and Engineering, National Taiwan University, 106, Taipei, Taiwan aut NATIONALLICENCE 700 1- Chuang Chien-Hsun Institute of Materials Science and Engineering, National Taiwan University, 106, Taipei, Taiwan aut NATIONALLICENCE 700 1- Lee Jun-Der Wire Technology Co., LTD, 432, Taichung, Taiwan aut NATIONALLICENCE 700 1- Tsai Hsing-Hua Wire Technology Co., LTD, 432, Taichung, Taiwan aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/3(2013-03-01), 545-551 0361-5235 42:3<545 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer