naa a22 4500 510803547 CHVBK 20180411083406.0 cr unu---uuuuu 180411e20130301xx s 000 0 eng 10.1007/s11664-012-2344-7 doi (NATIONALLICENCE)springer-10.1007/s11664-012-2344-7 Effect of Temperature Cycling on Conduction Mechanisms in CdTe Thin Films [Elektronische Daten] [V. Srivastav, R. Pal, N. Saini, R. Saxena, R. Bhan, L. Sareen, K. Singh, R. Sharma, V. Venkataraman] CdTe thin films of 500Å thickness prepared by thermal evaporation technique were analyzed for leakage current and conduction mechanisms. Metal-insulator-metal (MIM) capacitors were fabricated using these films as a dielectric. These films have many possible applications, such as passivation for infrared diodes that operate at low temperatures (80K). Direct-current (DC) current-voltage (I-V) and capacitance-voltage (C-V) measurements were performed on these films. Furthermore, the films were subjected to thermal cycling from 300K to 80K and back to 300K. Typical minimum leakage currents near zero bias at room temperature varied between 0.9nA and 0.1μA, while low-temperature leakage currents were in the range of 9.5pA to 0.5nA, corresponding to resistivity values on the order of 108Ω-cm and 1010Ω-cm, respectively. Well-known conduction mechanisms from the literature were utilized for fitting of measured I-V data. Our analysis indicates that the conduction mechanism in general is Ohmic for low fields <5×104Vcm−1, while the conduction mechanism for fields >6×104Vcm−1 is modified Poole-Frenkel (MPF) and Fowler-Nordheim (FN) tunneling at room temperature. At 80K, Schottky-type conduction dominates. A significant observation is that the film did not show any appreciable degradation in leakage current characteristics due to the thermal cycling. TMS, 2012 CdTe thin film nationallicence MIM nationallicence conduction mechanism nationallicence modified Poole-Frenkel nationallicence Richardson Schottky nationallicence Srivastav V. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut Pal R. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut Saini N. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut Saxena R. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut Bhan R. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut Sareen L. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut Singh K. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut Sharma R. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut Venkataraman V. Department of Physics, Indian Institute of Science, 560 012, Bangalore, India aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/3(2013-03-01), 389-397 0361-5235 42:3<389 2013 42 11664 https://doi.org/10.1007/s11664-012-2344-7 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-012-2344-7 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Srivastav V. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut NATIONALLICENCE 700 1- Pal R. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut NATIONALLICENCE 700 1- Saini N. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut NATIONALLICENCE 700 1- Saxena R. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut NATIONALLICENCE 700 1- Bhan R. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut NATIONALLICENCE 700 1- Sareen L. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut NATIONALLICENCE 700 1- Singh K. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut NATIONALLICENCE 700 1- Sharma R. Solid State Physics Laboratory, Lucknow Road, 110054, Delhi, India aut NATIONALLICENCE 700 1- Venkataraman V. Department of Physics, Indian Institute of Science, 560 012, Bangalore, India aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/3(2013-03-01), 389-397 0361-5235 42:3<389 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer