naa a22 4500 510803555 CHVBK 20180411083406.0 cr unu---uuuuu 180411e20130301xx s 000 0 eng 10.1007/s11664-012-2347-4 doi (NATIONALLICENCE)springer-10.1007/s11664-012-2347-4 Dielectric Tunability of DNA Biopolymer Films with Varying Amounts of Hexadecyltrimethylammonium Chloride [Elektronische Daten] [Roberto Aga Jr., Brian Telek, Jack Lombardi III, Emily Heckman, Carrie Bartsch] Deoxyribonucleic acid (DNA) biopolymer films are fabricated with varying amounts of hexadecyltrimethylammonium chloride (CTMA), which is a surfactant necessary to produce a DNA complex that is soluble in organic solvents. The dielectric constant (κ) of these films at microwave frequencies as a function of applied static electric field (E DC) is investigated. Results show that the dependence of κ on E DC, which is referred to as the dielectric tunability, is influenced by the amount of CTMA in the complex. Dielectric tunability is suppressed when the amount of CTMA is insufficient and improved when more CTMA is added. However, excessive amounts of CTMA also result in a very rough film surface that causes shorting problems when used in a capacitive structure. A varactor employing a 1-μm-thick DNA biopolymer film as the dielectric is demonstrated. Under 5V DC bias, which generates E DC=5V/μm, its capacitance at 15GHz changes by 0.04pF. This change corresponds to a relative dielectric tunability of 6.6%. A simple application of this varactor for modulation of the power transmitted through a microwave transmission line is also demonstrated. TMS, 2012 DNA biopolymer nationallicence varactor nationallicence dielectric tunability nationallicence microwave nationallicence Aga Jr. Roberto General Dynamics Information Technology, 45431, Dayton, OH, USA aut Telek Brian Department of Chemistry, University of Dayton, 45469, Dayton, OH, USA aut Lombardi III Jack Sensors Directorate, Air Force Research Laboratory, 45433, Wright-Patterson AFB, OH, USA aut Heckman Emily Sensors Directorate, Air Force Research Laboratory, 45433, Wright-Patterson AFB, OH, USA aut Bartsch Carrie Sensors Directorate, Air Force Research Laboratory, 45433, Wright-Patterson AFB, OH, USA aut Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/3(2013-03-01), 463-469 0361-5235 42:3<463 2013 42 11664 https://doi.org/10.1007/s11664-012-2347-4 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s11664-012-2347-4 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Aga Jr Roberto General Dynamics Information Technology, 45431, Dayton, OH, USA aut NATIONALLICENCE 700 1- Telek Brian Department of Chemistry, University of Dayton, 45469, Dayton, OH, USA aut NATIONALLICENCE 700 1- Lombardi III Jack Sensors Directorate, Air Force Research Laboratory, 45433, Wright-Patterson AFB, OH, USA aut NATIONALLICENCE 700 1- Heckman Emily Sensors Directorate, Air Force Research Laboratory, 45433, Wright-Patterson AFB, OH, USA aut NATIONALLICENCE 700 1- Bartsch Carrie Sensors Directorate, Air Force Research Laboratory, 45433, Wright-Patterson AFB, OH, USA aut NATIONALLICENCE 773 0- Journal of Electronic Materials Springer US; http://www.springer-ny.com 42/3(2013-03-01), 463-469 0361-5235 42:3<463 2013 42 11664 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer