<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>     naa a22        4500</leader>
  <controlfield tag="001">510803628</controlfield>
  <controlfield tag="003">CHVBK</controlfield>
  <controlfield tag="005">20180411083406.0</controlfield>
  <controlfield tag="007">cr unu---uuuuu</controlfield>
  <controlfield tag="008">180411e20130301xx      s     000 0 eng  </controlfield>
  <datafield tag="024" ind1="7" ind2="0">
   <subfield code="a">10.1007/s11664-012-2354-5</subfield>
   <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/s11664-012-2354-5</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
   <subfield code="a">Effects of Solvents in the Polyethylene Glycol Serieson the Bonding of Copper Joints Using Ag2O Paste</subfield>
   <subfield code="h">[Elektronische Daten]</subfield>
   <subfield code="c">[Shinya Takata, Tomo Ogura, Eiichi Ide, Toshiaki Morita, Akio Hirose]</subfield>
  </datafield>
  <datafield tag="520" ind1="3" ind2=" ">
   <subfield code="a">The effects of reducing solvents on the bonding process using silver oxide paste in a copper joint were investigated. Three solvent types were tested: diethylene glycol (DEG), triethylene glycol (TEG), and polyethylene glycol (PEG). The strength of the joints was assessed by fracturing, which occurred at the interface of the copper oxide layer and the copper substrate in DEG and TEG samples and at the bonded interface in the PEG sample. Analysis of the samples revealed that, in the DEG and TEG samples, the copper substrate was oxidized during the bonding process, which compromised the shear strength of the joints. In contrast, the PEG sample exhibited nonuniform sintering of the silver layer while retaining good shear strength. It was found that the combination of DEG and PEG produced optimum shear strength in the copper joint, as PEG suppressed the growth of copper oxide and DEG promoted the formation of a dense sintered silver layer. The bonding strength achieved was higher than that of the gold-to-gold joint made using standard Pb-5Sn solder.</subfield>
  </datafield>
  <datafield tag="540" ind1=" " ind2=" ">
   <subfield code="a">TMS, 2012</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">Ag nanoparticles</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">Ag oxide</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">reducing solvent</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">shear strength</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">Cu joint</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Takata</subfield>
   <subfield code="D">Shinya</subfield>
   <subfield code="u">Division of Materials and Manufacturing Science, Graduate School of Osaka University, 2-1 Yamadaoka, 565-0871, Suita, Japan</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Ogura</subfield>
   <subfield code="D">Tomo</subfield>
   <subfield code="u">Division of Materials and Manufacturing Science, Graduate School of Osaka University, 2-1 Yamadaoka, 565-0871, Suita, Japan</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Ide</subfield>
   <subfield code="D">Eiichi</subfield>
   <subfield code="u">Hitachi Research Laboratory, Hitachi Ltd., 7-1-1 Omika, 319-1292, Hitachi, Japan</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Morita</subfield>
   <subfield code="D">Toshiaki</subfield>
   <subfield code="u">Hitachi Research Laboratory, Hitachi Ltd., 7-1-1 Omika, 319-1292, Hitachi, Japan</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Hirose</subfield>
   <subfield code="D">Akio</subfield>
   <subfield code="u">Division of Materials and Manufacturing Science, Graduate School of Osaka University, 2-1 Yamadaoka, 565-0871, Suita, Japan</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
   <subfield code="t">Journal of Electronic Materials</subfield>
   <subfield code="d">Springer US; http://www.springer-ny.com</subfield>
   <subfield code="g">42/3(2013-03-01), 507-515</subfield>
   <subfield code="x">0361-5235</subfield>
   <subfield code="q">42:3&lt;507</subfield>
   <subfield code="1">2013</subfield>
   <subfield code="2">42</subfield>
   <subfield code="o">11664</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="u">https://doi.org/10.1007/s11664-012-2354-5</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="908" ind1=" " ind2=" ">
   <subfield code="D">1</subfield>
   <subfield code="a">research-article</subfield>
   <subfield code="2">jats</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/s11664-012-2354-5</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Takata</subfield>
   <subfield code="D">Shinya</subfield>
   <subfield code="u">Division of Materials and Manufacturing Science, Graduate School of Osaka University, 2-1 Yamadaoka, 565-0871, Suita, Japan</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Ogura</subfield>
   <subfield code="D">Tomo</subfield>
   <subfield code="u">Division of Materials and Manufacturing Science, Graduate School of Osaka University, 2-1 Yamadaoka, 565-0871, Suita, Japan</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Ide</subfield>
   <subfield code="D">Eiichi</subfield>
   <subfield code="u">Hitachi Research Laboratory, Hitachi Ltd., 7-1-1 Omika, 319-1292, Hitachi, Japan</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Morita</subfield>
   <subfield code="D">Toshiaki</subfield>
   <subfield code="u">Hitachi Research Laboratory, Hitachi Ltd., 7-1-1 Omika, 319-1292, Hitachi, Japan</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Hirose</subfield>
   <subfield code="D">Akio</subfield>
   <subfield code="u">Division of Materials and Manufacturing Science, Graduate School of Osaka University, 2-1 Yamadaoka, 565-0871, Suita, Japan</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">773</subfield>
   <subfield code="E">0-</subfield>
   <subfield code="t">Journal of Electronic Materials</subfield>
   <subfield code="d">Springer US; http://www.springer-ny.com</subfield>
   <subfield code="g">42/3(2013-03-01), 507-515</subfield>
   <subfield code="x">0361-5235</subfield>
   <subfield code="q">42:3&lt;507</subfield>
   <subfield code="1">2013</subfield>
   <subfield code="2">42</subfield>
   <subfield code="o">11664</subfield>
  </datafield>
  <datafield tag="900" ind1=" " ind2="7">
   <subfield code="a">Metadata rights reserved</subfield>
   <subfield code="b">Springer special CC-BY-NC licence</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="898" ind1=" " ind2=" ">
   <subfield code="a">BK010053</subfield>
   <subfield code="b">XK010053</subfield>
   <subfield code="c">XK010000</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
 </record>
</collection>
